Martinus Petrus Maria Bierhoff

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Deurne, NL

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Patents Grantslast 30 patents

Information Patent Grant
User interface for an electron microscope
- Patent number 9,865,427
- Issue date Jan 9, 2018
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of sampling a sample and displaying obtained information
- Patent number 9,762,863
- Issue date Sep 12, 2017
- FEI Company
- Pavel Potocek
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
User interface for an electron microscope
- Patent number 9,025,018
- Issue date May 5, 2015
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for centering an optical element in a TEM comprising a contr...
- Patent number 8,633,456
- Issue date Jan 21, 2014
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method of Sampling a Sample and Displaying Obtained Information
- Publication number 20140146160
- Publication date May 29, 2014
- FEI Company
- Pavel Potocek
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC LENS
- Publication number 20050012049
- Publication date Jan 20, 2005
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS