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Marvin L. Bernt
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Scappoose, OR, US
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last 30 patents
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Patent Grant
System for measuring the total integrated scatter of a surface
Patent number
5,661,556
Issue date
Aug 26, 1997
Schmitt Measurement Systems, Inc.
Tod F. Schiff
G01 - MEASURING TESTING
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Patent Grant
Methods and apparatus for characterizing a surface
Patent number
5,625,451
Issue date
Apr 29, 1997
Schmitt Measurement Systems, Inc.
Tod F. Schiff
G01 - MEASURING TESTING
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Patent Grant
Modular scatterometer with interchangeable scanning heads
Patent number
5,196,906
Issue date
Mar 23, 1993
TMA Technologies, Inc.
John C. Stover
G01 - MEASURING TESTING