MaryJane Brodsky

Person

Salt Point, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Concurrently forming nFET and pFET gate dielectric layers
- Patent number 9,059,315
- Issue date Jun 16, 2015
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Threshold voltage adjustment for thin body MOSFETs
- Patent number 9,040,399
- Issue date May 26, 2015
- International Business Machines Corporation
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite high-k gate dielectric stack for reducing gate leakage
- Patent number 9,029,959
- Issue date May 12, 2015
- International Business Machines Corporation
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Germanium oxide free atomic layer deposition of silicon oxide and h...
- Patent number 8,952,460
- Issue date Feb 10, 2015
- International Business Machines Corporation
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Germanium oxide free atomic layer deposition of silicon oxide and h...
- Patent number 8,809,152
- Issue date Aug 19, 2014
- International Business Machines Corporation
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deep trench capacitor in a SOI substrate having a laterally protrud...
- Patent number 8,198,169
- Issue date Jun 12, 2012
- International Business Machines Corporation
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deep trench capacitor in a SOI substrate having a laterally protrud...
- Patent number 7,888,723
- Issue date Feb 15, 2011
- International Business Machines Corporation
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shallow trench capacitor compatible with high-K / metal gate
- Patent number 7,875,919
- Issue date Jan 25, 2011
- International Business Machines Corporation
- Roger A. Booth, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical fuse having a thin fuselink
- Patent number 7,759,766
- Issue date Jul 20, 2010
- International Business Machines Corporation
- Roger A. Booth, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Embedded trench capacitor having a high-k node dielectric and a met...
- Patent number 7,671,394
- Issue date Mar 2, 2010
- International Business Machines Corporation
- Roger A. Booth, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting integrated circuits during fabrication
- Patent number 7,454,302
- Issue date Nov 18, 2008
- International Business Machines Corporation
- Colin J. Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, apparatus, and computer program product for optimizing insp...
- Patent number 7,397,556
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting integrated circuits during fabrication
- Patent number 7,310,585
- Issue date Dec 18, 2007
- International Business Machines Corporation
- Colin J. Brodsky
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Concurrently Forming nFET and pFET Gate Dielectric Layers
- Publication number 20140187028
- Publication date Jul 3, 2014
- GLOBALFOUNDRIES INC.
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GERMANIUM OXIDE FREE ATOMIC LAYER DEPOSITION OF SILICON OXIDE AND H...
- Publication number 20140061819
- Publication date Mar 6, 2014
- International Business Machines Corporation
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE HIGH-K GATE DIELECTRIC STACK FOR REDUCING GATE LEAKAGE
- Publication number 20140001570
- Publication date Jan 2, 2014
- GLOBALFOUNDRIES INC.
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GERMANIUM OXIDE FREE ATOMIC LAYER DEPOSITION OF SILICON OXIDE AND H...
- Publication number 20130126986
- Publication date May 23, 2013
- International Business Machines Corporation
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Threshold Voltage Adjustment For Thin Body Mosfets
- Publication number 20130105896
- Publication date May 2, 2013
- International Business Machines Corporation
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THRESHOLD VOLTAGE ADJUSTMENT FOR THIN BODY MOSFETS
- Publication number 20130105894
- Publication date May 2, 2013
- International Business Machines Corporation
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEEP TRENCH CAPACITOR IN A SOI SUBSTRATE HAVING A LATERALLY PROTRUD...
- Publication number 20110092043
- Publication date Apr 21, 2011
- International Business Machines Corporation
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHALLOW TRENCH CAPACITOR COMPATIBLE WITH HIGH-K / METAL GATE
- Publication number 20090242953
- Publication date Oct 1, 2009
- International Business Machines Corporation
- Roger A. Booth, JR.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEEP TRENCH CAPACITOR IN A SOI SUBSTRATE HAVING A LATERALLY PROTRUD...
- Publication number 20090184356
- Publication date Jul 23, 2009
- International Business Machines Corporation
- MaryJane Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMBEDDED TRENCH CAPACITOR HAVING A HIGH-K NODE DIELECTRIC AND A MET...
- Publication number 20090101956
- Publication date Apr 23, 2009
- International Business Machines Corporation
- Roger A. Booth, JR.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL FUSE HAVING A THIN FUSELINK
- Publication number 20090051002
- Publication date Feb 26, 2009
- International Business Machines Corporation
- Roger A. Booth, JR.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR OPTIMIZING INSP...
- Publication number 20080225284
- Publication date Sep 18, 2008
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR OPTIMIZING INSP...
- Publication number 20080100831
- Publication date May 1, 2008
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING INTEGRATED CIRCUITS DURING FABRICATION
- Publication number 20080033675
- Publication date Feb 7, 2008
- Colin J. Brodsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of inspecting integrated circuits during fabrication
- Publication number 20060258024
- Publication date Nov 16, 2006
- International Business Machines Corporation
- Colin J. Brodsky
- H01 - BASIC ELECTRIC ELEMENTS

MaryJane Brodsky

Person

Patents Grantslast 30 patents

Concurrently forming nFET and pFET gate dielectric layers

Threshold voltage adjustment for thin body MOSFETs

Composite high-k gate dielectric stack for reducing gate leakage

Germanium oxide free atomic layer deposition of silicon oxide and h...

Germanium oxide free atomic layer deposition of silicon oxide and h...

Deep trench capacitor in a SOI substrate having a laterally protrud...

Deep trench capacitor in a SOI substrate having a laterally protrud...

Shallow trench capacitor compatible with high-K / metal gate

Electrical fuse having a thin fuselink

Embedded trench capacitor having a high-k node dielectric and a met...

Method of inspecting integrated circuits during fabrication

Method, apparatus, and computer program product for optimizing insp...

Method of inspecting integrated circuits during fabrication

Patents Applicationslast 30 patents

Concurrently Forming nFET and pFET Gate Dielectric Layers

GERMANIUM OXIDE FREE ATOMIC LAYER DEPOSITION OF SILICON OXIDE AND H...

COMPOSITE HIGH-K GATE DIELECTRIC STACK FOR REDUCING GATE LEAKAGE

GERMANIUM OXIDE FREE ATOMIC LAYER DEPOSITION OF SILICON OXIDE AND H...

Threshold Voltage Adjustment For Thin Body Mosfets

THRESHOLD VOLTAGE ADJUSTMENT FOR THIN BODY MOSFETS

DEEP TRENCH CAPACITOR IN A SOI SUBSTRATE HAVING A LATERALLY PROTRUD...

SHALLOW TRENCH CAPACITOR COMPATIBLE WITH HIGH-K / METAL GATE

DEEP TRENCH CAPACITOR IN A SOI SUBSTRATE HAVING A LATERALLY PROTRUD...

EMBEDDED TRENCH CAPACITOR HAVING A HIGH-K NODE DIELECTRIC AND A MET...

ELECTRICAL FUSE HAVING A THIN FUSELINK

METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR OPTIMIZING INSP...

METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR OPTIMIZING INSP...

METHOD OF INSPECTING INTEGRATED CIRCUITS DURING FABRICATION

Method of inspecting integrated circuits during fabrication