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Masaaki Hanawa

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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20200141959
    • Publication date May 7, 2020
    • Masaki SHIBA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20190072576
    • Publication date Mar 7, 2019
    • Masaki Shiba
    • Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Information Patent Application

    SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
    • Publication number 20180038882
    • Publication date Feb 8, 2018
    • Hitachi High-Technologies Corporation
    • Hideyuki YANAMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE TEST AUTOMATION SYSTEM
    • Publication number 20170328926
    • Publication date Nov 16, 2017
    • Hitachi High-Technologies Corporation
    • Takahiro Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170010292
    • Publication date Jan 12, 2017
    • Hitachi High-Technologies Corporation
    • Masaki SHIBA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
    • Publication number 20140170022
    • Publication date Jun 19, 2014
    • Hitachi High-Technologies Corporation
    • Hideyuki YANAMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE TEST AUTOMATION SYSTEM
    • Publication number 20130061693
    • Publication date Mar 14, 2013
    • Hitachi High-Technologies Corporation
    • Takahiro Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE CONVEYING SYSTEM
    • Publication number 20120266698
    • Publication date Oct 25, 2012
    • Hitachi High-Technologies Corporation
    • Tetsuya Isobe
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
    • Publication number 20120230873
    • Publication date Sep 13, 2012
    • Hitachi High-Technologies Corporation
    • Hideyuki YANAMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20120183438
    • Publication date Jul 19, 2012
    • Hitachi High-Technologies Corporation
    • Masaki SHIBA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED SAMPLE TESTING SYSTEM
    • Publication number 20120177547
    • Publication date Jul 12, 2012
    • Hitachi High-Technologies Corporation
    • Tatsuya Fukugaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20120070343
    • Publication date Mar 22, 2012
    • Hitachi High-Technologies Corporation
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
    • Publication number 20110014085
    • Publication date Jan 20, 2011
    • Hitachi, Ltd
    • Hideyuki Yanami
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20060062692
    • Publication date Mar 23, 2006
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20050207938
    • Publication date Sep 22, 2005
    • Masaaki Hanawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    Reagent container
    • Publication number 20050142040
    • Publication date Jun 30, 2005
    • Masaaki Hanawa
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Reagent cassette and automatic analyzer using the same
    • Publication number 20050084426
    • Publication date Apr 21, 2005
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040253146
    • Publication date Dec 16, 2004
    • Masaki Shiba
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample dispensing apparatus and automatic analyzer including the same
    • Publication number 20040245275
    • Publication date Dec 9, 2004
    • Hideyuki Yanami
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040186360
    • Publication date Sep 23, 2004
    • Hiroyuki Suzuki
    • G01 - MEASURING TESTING