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Masaaki Komori
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for manufacturing semiconductor device
Patent number
11,977,099
Issue date
May 7, 2024
HITACHI HIGH-TECH CORPORATION
Tomohisa Ohtaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Evaluation apparatus for semiconductor device
Patent number
11,709,199
Issue date
Jul 25, 2023
HITACHI HIGH-TECH CORPORATION
Tomohisa Ohtaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor inspection device and probe unit
Patent number
11,513,138
Issue date
Nov 29, 2022
HITACHI HIGH-TECH CORPORATION
Masaaki Komori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe module and probe
Patent number
11,391,756
Issue date
Jul 19, 2022
HITACHI HIGH-TECH CORPORATION
Ryo Hirano
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic response analysis prober device
Patent number
10,782,340
Issue date
Sep 22, 2020
HITACHI HIGH-TECH CORPORATION
Masaaki Komori
G02 - OPTICS
Information
Patent Grant
Control device for electric motor and hydraulic pressure supply system
Patent number
10,746,171
Issue date
Aug 18, 2020
Mitsubishi Electric Corporation
Masaaki Komori
F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information
Patent Grant
Specimen inspection equipment and how to make the electron beam abs...
Patent number
8,178,840
Issue date
May 15, 2012
Hitachi High-Technologies Corporation
Tomoharu Obuki
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus having a heating mechanism for performing samp...
Patent number
8,040,146
Issue date
Oct 18, 2011
Hitachi High-Technologies Corporation
Takeshi Sunaoshi
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and method
Patent number
7,663,390
Issue date
Feb 16, 2010
Hitachi High-Technologies Corporation
Takeshi Sunaoshi
G01 - MEASURING TESTING
Information
Patent Grant
Specimen inspection equipment and how to make electron beam absorbe...
Patent number
7,663,104
Issue date
Feb 16, 2010
Hitachi High-Technologies Corporation
Tomoharu Obuki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Semiconductor Inspection Device and Probe Unit
Publication number
20210263075
Publication date
Aug 26, 2021
Hitachi High-Tech Corporation
Masaaki KOMORI
G01 - MEASURING TESTING
Information
Patent Application
Method for Manufacturing Semiconductor Device
Publication number
20210048450
Publication date
Feb 18, 2021
Hitachi High-Tech Corporation
Tomohisa OHTAKI
G01 - MEASURING TESTING
Information
Patent Application
Probe Module and Probe
Publication number
20210033642
Publication date
Feb 4, 2021
Hitachi High-Tech Corporation
Ryo HIRANO
G01 - MEASURING TESTING
Information
Patent Application
Evaluation Apparatus for Semiconductor Device
Publication number
20210025936
Publication date
Jan 28, 2021
Hitachi High-Tech Corporation
Tomohisa OHTAKI
G01 - MEASURING TESTING
Information
Patent Application
CONTROL DEVICE FOR ELECTRIC MOTOR AND HYDRAULIC PRESSURE SUPPLY SYSTEM
Publication number
20180347416
Publication date
Dec 6, 2018
Mitsubishi Electric Corporation
Masaaki KOMORI
F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information
Patent Application
Dynamic Response Analysis Prober Device
Publication number
20180299504
Publication date
Oct 18, 2018
Hitachi High-Technologies Corporation
Masaaki KOMORI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING SEMICONDUCTOR USING ABSORBED CU...
Publication number
20110291692
Publication date
Dec 1, 2011
Tohru Ando
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND METHOD
Publication number
20100123474
Publication date
May 20, 2010
Hitachi High-Technologies Corporation
Takeshi Sunaoshi
G01 - MEASURING TESTING
Information
Patent Application
Specimen Inspection Equipment and How to Make the Electron Beam Abs...
Publication number
20100116986
Publication date
May 13, 2010
Hitachi High-Technologies Corporation
Tomoharu OBUKI
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND METHOD
Publication number
20090009203
Publication date
Jan 8, 2009
Takeshi SUNAOSHI
G01 - MEASURING TESTING
Information
Patent Application
Specimen Inspection Equipment and How to Make the Electron Beam Abs...
Publication number
20080203297
Publication date
Aug 28, 2008
Hitachi High-Technologies Corporation
Tomoharu OBUKI
G01 - MEASURING TESTING