Masaaki Namba

Person

Sayama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Fabrication method of semiconductor integrated circuit device
- Patent number 7,422,914
- Issue date Sep 9, 2008
- Renesas Technology Corp.
- Yuji Wada
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing a memory device in quasi-operating...
- Patent number 7,356,742
- Issue date Apr 8, 2008
- Renesas Technology Corp.
- Hideyuki Aoki
- G11 - INFORMATION STORAGE
Information Patent Grant
Fabrication method of semiconductor integrated circuit device
- Patent number 7,306,957
- Issue date Dec 11, 2007
- Renesas Technology Corp.
- Yuji Wada
- G11 - INFORMATION STORAGE
Information Patent Grant
Packaging device for holding a plurality of semiconductor devices t...
- Patent number 6,864,568
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication method of semiconductor integrated circuit device and i...
- Patent number 6,696,849
- Issue date Feb 24, 2004
- Renesas Technology Corporation
- Naoto Ban
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing semiconductor device and apparatus usable therein
- Patent number 6,465,264
- Issue date Oct 15, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20080293167
- Publication date Nov 27, 2008
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20080070330
- Publication date Mar 20, 2008
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing a memory device in quasi-operating...
- Publication number 20050193274
- Publication date Sep 1, 2005
- Hitachi, Ltd.
- Hideyuki Aoki
- G11 - INFORMATION STORAGE
Information Patent Application
Fabrication method of semiconductor integrated circuit device
- Publication number 20050153465
- Publication date Jul 14, 2005
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Application
Fabrication method of semiconductor integrated circuit device and i...
- Publication number 20040135593
- Publication date Jul 15, 2004
- Naoto Ban
- G01 - MEASURING TESTING
Information Patent Application
Packaging device for holding a plurality of semiconductor devices t...
- Publication number 20030015779
- Publication date Jan 23, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Method of testing memory device, method of manufacturing memory dev...
- Publication number 20020046374
- Publication date Apr 18, 2002
- Hideyuki Aoki
- G11 - INFORMATION STORAGE
Information Patent Application
Fabrication method of semiconductor integrated circuit device and i...
- Publication number 20020039802
- Publication date Apr 4, 2002
- Naoto Ban
- G01 - MEASURING TESTING

Masaaki Namba

Person

Patents Grantslast 30 patents

Fabrication method of semiconductor integrated circuit device

Method and apparatus for testing a memory device in quasi-operating...

Fabrication method of semiconductor integrated circuit device

Packaging device for holding a plurality of semiconductor devices t...

Fabrication method of semiconductor integrated circuit device and i...

Method for producing semiconductor device and apparatus usable therein

Patents Applicationslast 30 patents

FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

Method and apparatus for testing a memory device in quasi-operating...

Fabrication method of semiconductor integrated circuit device

Fabrication method of semiconductor integrated circuit device and i...

Packaging device for holding a plurality of semiconductor devices t...

Method of testing memory device, method of manufacturing memory dev...

Fabrication method of semiconductor integrated circuit device and i...