Masaaki Nojiri

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 12,174,551
- Issue date Dec 24, 2024
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 11,353,798
- Issue date Jun 7, 2022
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device for scanning a sample using a charged...
- Patent number 8,421,010
- Issue date Apr 16, 2013
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus for inspecting patterns of substrate
- Patent number 8,134,697
- Issue date Mar 13, 2012
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus for inspecting patterns of a substrate
- Patent number 8,036,447
- Issue date Oct 11, 2011
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit pattern inspection apparatus
- Patent number 7,696,487
- Issue date Apr 13, 2010
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G01 - MEASURING TESTING
Information Patent Grant
Circuit-pattern inspection apparatus
- Patent number 7,532,328
- Issue date May 12, 2009
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit-pattern inspection apparatus
- Patent number 7,292,327
- Issue date Nov 6, 2007
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus for circuit pattern
- Patent number 7,223,975
- Issue date May 29, 2007
- Hitachi, Ltd.
- Yasuhiko Nara
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Pattern Measurement Device and Pattern Measurement Method
- Publication number 20220260930
- Publication date Aug 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measurement Device and Pattern Measurement Method
- Publication number 20200278615
- Publication date Sep 3, 2020
- Hitachi High-Technologies Corporation
- Takuma YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT PATTERN INSPECTING DEVICE AND INSPECTING METHOD THEREOF
- Publication number 20130271595
- Publication date Oct 17, 2013
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT PATTERN INSPECTION APPARATUS AND CIRCUIT PATTERN INSPECTION...
- Publication number 20130082177
- Publication date Apr 4, 2013
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTING APPARATUS AND PATTERN INSPECTING METHOD
- Publication number 20110298915
- Publication date Dec 8, 2011
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20110163230
- Publication date Jul 7, 2011
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS FOR CIRCUIT PATTERN
- Publication number 20100019148
- Publication date Jan 28, 2010
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS FOR INSPECTING PATTERNS OF A SUBSTRATE
- Publication number 20100008564
- Publication date Jan 14, 2010
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20090261251
- Publication date Oct 22, 2009
- Hitachi High-Technologies Corporation
- Koichi HAYAKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS FOR INSPECTING PATTERNS OF SUBSTRATE
- Publication number 20090208091
- Publication date Aug 20, 2009
- HITACHI HIGH-TECHNOLOIES CORPORATION
- Koichi Hayakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit-pattern inspection apparatus
- Publication number 20080174772
- Publication date Jul 24, 2008
- Hitachi, Ltd
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection apparatus for circuit pattern
- Publication number 20070284526
- Publication date Dec 13, 2007
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit pattern inspection apparatus
- Publication number 20070114397
- Publication date May 24, 2007
- Koichi Hayakawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus for inspecting patterns of a substrate
- Publication number 20060171593
- Publication date Aug 3, 2006
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit-pattern inspection apparatus
- Publication number 20050043903
- Publication date Feb 24, 2005
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection apparatus for circuit pattern
- Publication number 20040227079
- Publication date Nov 18, 2004
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- H01 - BASIC ELECTRIC ELEMENTS

Masaaki Nojiri

Person

Patents Grantslast 30 patents

Pattern measurement device and pattern measurement method

Pattern measurement device and pattern measurement method

Charged particle beam device for scanning a sample using a charged...

Inspection apparatus for inspecting patterns of substrate

Inspection apparatus for inspecting patterns of a substrate

Circuit pattern inspection apparatus

Circuit-pattern inspection apparatus

Circuit-pattern inspection apparatus

Inspection apparatus for circuit pattern

Patents Applicationslast 30 patents

Pattern Measurement Device and Pattern Measurement Method

Pattern Measurement Device and Pattern Measurement Method

CIRCUIT PATTERN INSPECTING DEVICE AND INSPECTING METHOD THEREOF

CIRCUIT PATTERN INSPECTION APPARATUS AND CIRCUIT PATTERN INSPECTION...

PATTERN INSPECTING APPARATUS AND PATTERN INSPECTING METHOD

CHARGED PARTICLE BEAM DEVICE

INSPECTION APPARATUS FOR CIRCUIT PATTERN

INSPECTION APPARATUS FOR INSPECTING PATTERNS OF A SUBSTRATE

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS FOR INSPECTING PATTERNS OF SUBSTRATE

Circuit-pattern inspection apparatus

Inspection apparatus for circuit pattern

Circuit pattern inspection apparatus

Inspection apparatus for inspecting patterns of a substrate

Circuit-pattern inspection apparatus

Inspection apparatus for circuit pattern