Masaaki Tanimura

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting semiconductor device, semiconductor device, an...
- Patent number 12,078,659
- Issue date Sep 3, 2024
- Renesas Electronics Corporation
- Masaaki Tanimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and burn-in test method thereof
- Patent number 11,372,042
- Issue date Jun 28, 2022
- Renesas Electronics Corporation
- Koji Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit and test system for testing the same
- Patent number 7,222,279
- Issue date May 22, 2007
- Renesas Technology Corp.
- Masaaki Tanimura
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing apparatus including testing board having wirings connected...
- Patent number 6,784,684
- Issue date Aug 31, 2004
- Renesas Technology Corp.
- Masaaki Tanimura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of inspecting semiconductor integrated circuit
- Patent number 6,774,657
- Issue date Aug 10, 2004
- Renesas Technology Corp.
- Osamu Hashimoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspecting system for inspecting a semiconductor inte...
- Patent number 6,750,672
- Issue date Jun 15, 2004
- Renesas Technology Corp.
- Masaaki Tanimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and method for testing the same
- Patent number 6,479,363
- Issue date Nov 12, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Masaaki Tanimura
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having a test mode and semiconductor te...
- Patent number 6,317,373
- Issue date Nov 13, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Masaaki Tanimura
- G11 - INFORMATION STORAGE
Information Patent Grant
Synchronous semiconductor memory device in which current consumed b...
- Patent number 5,880,998
- Issue date Mar 9, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Masaaki Tanimura
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AN...
- Publication number 20240142497
- Publication date May 2, 2024
- RENESAS ELECTRONICS CORPORATION
- Masaaki TANIMURA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND BURN-IN TEST METHOD THEREOF
- Publication number 20210123972
- Publication date Apr 29, 2021
- RENESAS ELECTRONICS CORPORATION
- Koji SUZUKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor integrated circuit and test system for testing the same
- Publication number 20070198885
- Publication date Aug 23, 2007
- Renesas Technology Corp.
- Masaaki Tanimura
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit and test system for testing the same
- Publication number 20040143782
- Publication date Jul 22, 2004
- RENESAS TECHNOLOGY CORP.
- Masaaki Tanimura
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus including testing board having wirings connected...
- Publication number 20030057940
- Publication date Mar 27, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Masaaki Tanimura
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor inspecting system for inspecting a semiconductor inte...
- Publication number 20030016045
- Publication date Jan 23, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Masaaki Tanimura
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method of inspecting semiconductor integrated circuit
- Publication number 20010050569
- Publication date Dec 13, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Osamu Hashimoto
- G01 - MEASURING TESTING

Masaaki Tanimura

Person

Patents Grantslast 30 patents

Method of inspecting semiconductor device, semiconductor device, an...

Semiconductor device and burn-in test method thereof

Semiconductor integrated circuit and test system for testing the same

Testing apparatus including testing board having wirings connected...

Apparatus and method of inspecting semiconductor integrated circuit

Semiconductor inspecting system for inspecting a semiconductor inte...

Semiconductor integrated circuit and method for testing the same

Semiconductor memory device having a test mode and semiconductor te...

Synchronous semiconductor memory device in which current consumed b...

Patents Applicationslast 30 patents

METHOD OF INSPECTING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AN...

SEMICONDUCTOR DEVICE AND BURN-IN TEST METHOD THEREOF

Semiconductor integrated circuit and test system for testing the same

Semiconductor integrated circuit and test system for testing the same

Testing apparatus including testing board having wirings connected...

Semiconductor inspecting system for inspecting a semiconductor inte...

Apparatus and method of inspecting semiconductor integrated circuit