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Masae Matsumoto
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Tokyo-to, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Inclination sensor and data acquisition device
Patent number
12,123,543
Issue date
Oct 22, 2024
Topcon Corporation
Fumitoshi Kasahara
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Electro-optical distance meter and electro-optical distance measure...
Patent number
11,269,074
Issue date
Mar 8, 2022
Topcon Corporation
Naoki Shoji
G01 - MEASURING TESTING
Information
Patent Grant
Electronic distance meter and modulated frequency determination met...
Patent number
11,105,903
Issue date
Aug 31, 2021
TOPCON Corporation
Naoki Shoji
G01 - MEASURING TESTING
Information
Patent Grant
Phase difference frequency generating method, phase difference freq...
Patent number
11,105,926
Issue date
Aug 31, 2021
TOPCON Corporation
Masaho Kikuchi
G01 - MEASURING TESTING
Information
Patent Grant
Laser scanner and method for detecting mobile object
Patent number
9,019,477
Issue date
Apr 28, 2015
Kabushiki Kaisha Topcon
Masae Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Electronic distance measuring method and electronic distance measur...
Patent number
8,908,158
Issue date
Dec 9, 2014
Kabushiki Kaisha Topcon
Ken-ichiro Yoshino
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INCLINATION SENSOR AND DATA ACQUISITION DEVICE
Publication number
20220307646
Publication date
Sep 29, 2022
TOPCON CORPORATION
Fumitoshi KASAHARA
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
SURVEYING SYSTEM
Publication number
20220308183
Publication date
Sep 29, 2022
TOPCON CORPORATION
Masae MATSUMOTO
G02 - OPTICS
Information
Patent Application
ELECTRO-OPTICAL DISTANCE METER AND ELECTRO-OPTICAL DISTANCE MEASURE...
Publication number
20200072977
Publication date
Mar 5, 2020
TOPCON CORPORATION
Naoki Shoji
G01 - MEASURING TESTING
Information
Patent Application
Electronic Distance Meter And Modulated Frequency Determination Met...
Publication number
20190120944
Publication date
Apr 25, 2019
TOPCON Corporation
Naoki Shoji
G01 - MEASURING TESTING
Information
Patent Application
Phase Difference Frequency Generating Method, Phase Difference Freq...
Publication number
20180356522
Publication date
Dec 13, 2018
TOPCON Corporation
Masaho Kikuchi
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF INTERPOLATING READ-OUT SIGNAL OF INCREMENTAL ENCODER
Publication number
20160103001
Publication date
Apr 14, 2016
KABUSHIKI KAISHA TOPCON
Satoshi YANOBE
G01 - MEASURING TESTING
Information
Patent Application
Electronic Distance Measuring Method And Electronic Distance Measur...
Publication number
20130003040
Publication date
Jan 3, 2013
Kabushiki Kaisha TOPCON
Ken-ichiro Yoshino
G01 - MEASURING TESTING
Information
Patent Application
Laser Scanner And Method For Detecting Mobile Object
Publication number
20120249997
Publication date
Oct 4, 2012
Kabushiki Kaisha TOPCON
Masae Matsumoto
G01 - MEASURING TESTING