Masafumi Kyogaku

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electroconductive elastic body, electrophotographic member, process...
- Patent number 11,556,073
- Issue date Jan 17, 2023
- Canon Kabushiki Kaisha
- Yasuhiro Fushimoto
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Electro-conductive member, method for producing same, process cartr...
- Patent number 11,307,509
- Issue date Apr 19, 2022
- Canon Kabushiki Kaisha
- Tetsuo Hino
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Laser scanning microscope apparatus
- Patent number 10,690,897
- Issue date Jun 23, 2020
- Canon Kabushiki Kaisha
- Koji Makara
- G02 - OPTICS
Information Patent Grant
Information processing device to process spectral information, and...
- Patent number 10,184,885
- Issue date Jan 22, 2019
- Canon Kabushiki Kaisha
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer and mass image analyzing system
- Patent number 9,627,177
- Issue date Apr 18, 2017
- Canon Kabushiki Kaisha
- Naofumi Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass distribution spectrometry method and mass distribution spectro...
- Patent number 9,312,116
- Issue date Apr 12, 2016
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing sample using secondary ion emitted from sample...
- Patent number 9,267,902
- Issue date Feb 23, 2016
- Canon Kabushiki Kaisha
- Manabu Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Ionization device, mass spectrometry apparatus, mass spectrometry m...
- Patent number 9,252,004
- Issue date Feb 2, 2016
- Canon Kabushiki Kaisha
- Yoichi Otsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization apparatus, mass spectrometer including ionization appara...
- Patent number 9,230,787
- Issue date Jan 5, 2016
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light source adjustment unit, optical measurement device, subject i...
- Patent number 9,134,246
- Issue date Sep 15, 2015
- Canon Kabushiki Kaisha
- Jumpei Naito
- G01 - MEASURING TESTING
Information Patent Grant
Ion group irradiation device and secondary ion mass spectrometer
- Patent number 8,963,078
- Issue date Feb 24, 2015
- Canon Kabushiki Kaisha
- Yohei Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization apparatus, mass spectrometer including ionization appara...
- Patent number 8,957,370
- Issue date Feb 17, 2015
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- G01 - MEASURING TESTING
Information Patent Grant
Mass distribution measuring method and mass distribution measuring...
- Patent number 8,637,808
- Issue date Jan 28, 2014
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Driving method for electron-emitting device, driving method for ele...
- Patent number 7,432,883
- Issue date Oct 7, 2008
- Canon Kabushiki Kaisha
- Kazunari Oyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source, and image display apparatus
- Patent number 7,138,759
- Issue date Nov 21, 2006
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source and image-forming apparat...
- Patent number 7,067,336
- Issue date Jun 27, 2006
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron emitting device, electron source and image display device...
- Patent number 6,992,428
- Issue date Jan 31, 2006
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source and image-forming apparat...
- Patent number 6,900,581
- Issue date May 31, 2005
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron emitting device, electron source and image display device...
- Patent number 6,831,399
- Issue date Dec 14, 2004
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
Information Patent Grant
Method of transforming polymer films into carbon films
- Patent number 6,817,915
- Issue date Nov 16, 2004
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning atomic force microscope
- Patent number 5,567,872
- Issue date Oct 22, 1996
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
ELECTROCONDUCTIVE ELASTIC BODY, ELECTROPHOTOGRAPHIC MEMBER, PROCESS...
- Publication number 20210373448
- Publication date Dec 2, 2021
- Canon Kabushiki Kaisha
- Yasuhiro Fushimoto
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
ELECTRO-CONDUCTIVE MEMBER, METHOD FOR PRODUCING SAME, PROCESS CARTR...
- Publication number 20210048759
- Publication date Feb 18, 2021
- Canon Kabushiki Kaisha
- Tetsuo Hino
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INFORMATION PROCESSING DEVICE TO PROCESS SPECTRAL INFORMATION, AND...
- Publication number 20170322146
- Publication date Nov 9, 2017
- Canon Kabushiki Kaisha
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
LASER SCANNING MICROSCOPE APPARATUS
- Publication number 20160306152
- Publication date Oct 20, 2016
- Canon Kabushiki Kaisha
- Koji Makara
- G02 - OPTICS
Information Patent Application
PROBE DISPLACEMENT MEASURING APPARATUS, IONIZATION APPARATUS INCLUD...
- Publication number 20160203968
- Publication date Jul 14, 2016
- Canon Kabushiki Kaisha
- Yoichi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL MICROSCOPY DEVICE
- Publication number 20160123813
- Publication date May 5, 2016
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- G02 - OPTICS
Information Patent Application
SPECTRAL MICROSCOPY DEVICE
- Publication number 20160123812
- Publication date May 5, 2016
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- G02 - OPTICS
Information Patent Application
MASS MICROSCOPE APPARATUS
- Publication number 20160099139
- Publication date Apr 7, 2016
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION DEVICE, MASS SPECTROMETRY APPARATUS, MASS SPECTROMETRY M...
- Publication number 20150318157
- Publication date Nov 5, 2015
- Canon Kabushiki Kaisha
- Yoichi Otsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION DEVICE, MASS SPECTROMETRY APPARATUS, MASS SPECTROMETRY M...
- Publication number 20150311055
- Publication date Oct 29, 2015
- Canon Kabushiki Kaisha
- Yoichi Otsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...
- Publication number 20150311057
- Publication date Oct 29, 2015
- Canon Kabushiki Kaisha
- Yohei Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS IMAGE ANALYZING SYSTEM
- Publication number 20150155132
- Publication date Jun 4, 2015
- Canon Kabushiki Kaisha
- Naofumi Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION APPARATUS, MASS SPECTROMETER INCLUDING IONIZATION APPARA...
- Publication number 20150155148
- Publication date Jun 4, 2015
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS DISTRIBUTION MEASUREMENT METHOD AND MASS DISTRIBUTION MEASUREM...
- Publication number 20150115148
- Publication date Apr 30, 2015
- Canon Kabushiki Kaisha
- Naofumi Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS DISTRIBUTION MEASUREMENT METHOD AND MASS DISTRIBUTION MEASUREM...
- Publication number 20150115149
- Publication date Apr 30, 2015
- Canon Kabushiki Kaisha
- Naofumi Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION APPARATUS, MASS SPECTROMETER INCLUDING IONIZATION APPARA...
- Publication number 20150034821
- Publication date Feb 5, 2015
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION DEVICE, MASS SPECTROMETRY APPARATUS, MASS SPECTROMETRY M...
- Publication number 20150034817
- Publication date Feb 5, 2015
- Canon Kabushiki Kaisha
- Yoichi Otsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GROUP IRRADIATION DEVICE AND SECONDARY ION MASS SPECTROMETER
- Publication number 20140374587
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...
- Publication number 20140374585
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...
- Publication number 20140374586
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE ADJUSTMENT UNIT, OPTICAL MEASUREMENT DEVICE, SUBJECT I...
- Publication number 20140353504
- Publication date Dec 4, 2014
- Jumpei Naito
- G02 - OPTICS
Information Patent Application
MASS DISTRIBUTION SPECTROMETRY METHOD AND MASS DISTRIBUTION SPECTRO...
- Publication number 20140224979
- Publication date Aug 14, 2014
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS METHOD AND ANALYZER
- Publication number 20130320204
- Publication date Dec 5, 2013
- Canon Kabushiki Kaisha
- Manabu Komatsu
- G01 - MEASURING TESTING
Information Patent Application
MASS DISTRIBUTION MEASURING METHOD AND MASS DISTRIBUTION MEASURING...
- Publication number 20130092831
- Publication date Apr 18, 2013
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE DISPLAY APPARATUS
- Publication number 20100066235
- Publication date Mar 18, 2010
- Canon Kabushiki Kaisha
- Kazunari Ooyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron-emitting device, electron source, and image display apparatus
- Publication number 20040183428
- Publication date Sep 23, 2004
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- B82 - NANO-TECHNOLOGY
Information Patent Application
Driving method for electron-emitting device, driving method for ele...
- Publication number 20040183757
- Publication date Sep 23, 2004
- Canon Kabushiki Kaisha
- Kazunari Oyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron-emitting device, electron source and image-forming apparat...
- Publication number 20040155567
- Publication date Aug 12, 2004
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of transforming polymer films into carbon films
- Publication number 20030162464
- Publication date Aug 28, 2003
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron emitting device, electron source and image display device...
- Publication number 20030124944
- Publication date Jul 3, 2003
- Masafumi Kyogaku
- H01 - BASIC ELECTRIC ELEMENTS

Masafumi Kyogaku

Person

Patents Grantslast 30 patents

Electroconductive elastic body, electrophotographic member, process...

Electro-conductive member, method for producing same, process cartr...

Laser scanning microscope apparatus

Information processing device to process spectral information, and...

Mass spectrometer and mass image analyzing system

Mass distribution spectrometry method and mass distribution spectro...

Method of analyzing sample using secondary ion emitted from sample...

Ionization device, mass spectrometry apparatus, mass spectrometry m...

Ionization apparatus, mass spectrometer including ionization appara...

Light source adjustment unit, optical measurement device, subject i...

Ion group irradiation device and secondary ion mass spectrometer

Ionization apparatus, mass spectrometer including ionization appara...

Mass distribution measuring method and mass distribution measuring...

Driving method for electron-emitting device, driving method for ele...

Electron-emitting device, electron source, and image display apparatus

Electron-emitting device, electron source and image-forming apparat...

Electron emitting device, electron source and image display device...

Electron-emitting device, electron source and image-forming apparat...

Electron emitting device, electron source and image display device...

Method of transforming polymer films into carbon films

Scanning atomic force microscope

Patents Applicationslast 30 patents

ELECTROCONDUCTIVE ELASTIC BODY, ELECTROPHOTOGRAPHIC MEMBER, PROCESS...

ELECTRO-CONDUCTIVE MEMBER, METHOD FOR PRODUCING SAME, PROCESS CARTR...

INFORMATION PROCESSING DEVICE TO PROCESS SPECTRAL INFORMATION, AND...

LASER SCANNING MICROSCOPE APPARATUS

PROBE DISPLACEMENT MEASURING APPARATUS, IONIZATION APPARATUS INCLUD...

SPECTRAL MICROSCOPY DEVICE

SPECTRAL MICROSCOPY DEVICE

MASS MICROSCOPE APPARATUS

IONIZATION DEVICE, MASS SPECTROMETRY APPARATUS, MASS SPECTROMETRY M...

IONIZATION DEVICE, MASS SPECTROMETRY APPARATUS, MASS SPECTROMETRY M...

ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...

MASS SPECTROMETER AND MASS IMAGE ANALYZING SYSTEM

IONIZATION APPARATUS, MASS SPECTROMETER INCLUDING IONIZATION APPARA...

MASS DISTRIBUTION MEASUREMENT METHOD AND MASS DISTRIBUTION MEASUREM...

MASS DISTRIBUTION MEASUREMENT METHOD AND MASS DISTRIBUTION MEASUREM...

IONIZATION APPARATUS, MASS SPECTROMETER INCLUDING IONIZATION APPARA...

IONIZATION DEVICE, MASS SPECTROMETRY APPARATUS, MASS SPECTROMETRY M...

ION GROUP IRRADIATION DEVICE AND SECONDARY ION MASS SPECTROMETER

ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...

ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...

LIGHT SOURCE ADJUSTMENT UNIT, OPTICAL MEASUREMENT DEVICE, SUBJECT I...

MASS DISTRIBUTION SPECTROMETRY METHOD AND MASS DISTRIBUTION SPECTRO...

SAMPLE ANALYSIS METHOD AND ANALYZER

MASS DISTRIBUTION MEASURING METHOD AND MASS DISTRIBUTION MEASURING...

IMAGE DISPLAY APPARATUS

Electron-emitting device, electron source, and image display apparatus

Driving method for electron-emitting device, driving method for ele...

Electron-emitting device, electron source and image-forming apparat...

Method of transforming polymer films into carbon films

Electron emitting device, electron source and image display device...