Masafumi SATO

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Evaluation substrate, defect examination method and defect detectio...
- Patent number 9,176,073
- Issue date Nov 3, 2015
- Dai Nippon Printing Co., Ltd.
- Shinji Maekawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EVALUATION SUBSTRATE, DEFECT EXAMINATION METHOD AND DEFECT DETECTIO...
- Publication number 20130258330
- Publication date Oct 3, 2013
- DAI NIPPON PRINTING CO., LTD.
- Shinji MAEKAWA
- G01 - MEASURING TESTING