Membership
Tour
Register
Log in
Masafumi Take
Follow
Person
Chiba-shi, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Thermogravimetry apparatus
Patent number
6,709,153
Issue date
Mar 23, 2004
SII NanoTechnology Inc.
Rintaro Nakatani
G01 - MEASURING TESTING
Information
Patent Grant
Viscoelasticity measurement apparatus
Patent number
6,205,862
Issue date
Mar 27, 2001
Seiko Instruments Inc.
Nobutaka Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Automatic cooling apparatus
Patent number
5,418,351
Issue date
May 23, 1995
Seiko Instruments Inc.
Masafumi Take
G05 - CONTROLLING REGULATING
Information
Patent Grant
Parallel plate dielectric constant measuring apparatus having means...
Patent number
5,389,884
Issue date
Feb 14, 1995
Seiko Instruments Inc.
Nobutaka Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Dielectric constant-measuring apparatus
Patent number
5,345,183
Issue date
Sep 6, 1994
Seiko Instruments Inc.
Masafumi Take
G01 - MEASURING TESTING
Information
Patent Grant
Automatic cooling system
Patent number
5,117,639
Issue date
Jun 2, 1992
Seiko Instruments, Inc.
Masafumi Take
G05 - CONTROLLING REGULATING
Information
Patent Grant
Thermal analysis apparatus
Patent number
5,013,159
Issue date
May 7, 1991
Seiko Instruments, Inc.
Nobutaka Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Amplitude measurement device for viscoelasticity analysis
Patent number
4,984,469
Issue date
Jan 15, 1991
Seiko Instruments, Inc.
Masafumi Take
G01 - MEASURING TESTING
Information
Patent Grant
High-resolution A/D converter
Patent number
4,734,678
Issue date
Mar 29, 1988
Seiko Instruments Inc.
Masafumi Take
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
Thermogravimetry apparatus
Publication number
20030086471
Publication date
May 8, 2003
Rintaro Nakatani
G01 - MEASURING TESTING