Masafumi Watanabe

Person

Chiba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Friction force microscope
- Patent number 8,601,609
- Issue date Dec 3, 2013
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining a spring constant of a cantilever and scannin...
- Patent number 8,584,261
- Issue date Nov 12, 2013
- SII NanoTechnology Inc.
- Masafumi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Approach method for probe and sample in scanning probe microscope
- Patent number 8,024,816
- Issue date Sep 20, 2011
- SII NanoTechnology Inc.
- Masato Iyoki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Positioning apparatus and scanning probe microscope employing the same
- Patent number 8,001,831
- Issue date Aug 23, 2011
- SII Nano Technology Inc.
- Masafumi Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample manipulating apparatus
- Patent number 7,926,328
- Issue date Apr 19, 2011
- Sii Nano Technology Inc.
- Masatoshi Yasutake
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Piezoelectric actuator and scanning probe microscope using the same
- Patent number 7,427,744
- Issue date Sep 23, 2008
- SII NanoTechnology Inc.
- Masafumi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and measuring method by means of the same
- Patent number 7,251,987
- Issue date Aug 7, 2007
- SII NanoTechnology Inc.
- Masafumi Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE SHAPE EVALUATION METHOD FOR A SCANNING PROBE MICROSCOPE
- Publication number 20130180019
- Publication date Jul 11, 2013
- SII NANOTECHNOLOGY INC.
- Masafumi WATANABE
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD OF DETERMINING A SPRING CONSTANT OF A CANTILEVER AND SCANNIN...
- Publication number 20130061357
- Publication date Mar 7, 2013
- Masafumi Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Application
FRICTION FORCE MICROSCOPE
- Publication number 20120227139
- Publication date Sep 6, 2012
- Masatoshi YASUTAKE
- G01 - MEASURING TESTING
Information Patent Application
APPROACH METHOD FOR PROBE AND SAMPLE IN SCANNING PROBE MICROSCOPE
- Publication number 20100205697
- Publication date Aug 12, 2010
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MANIPULATING APPARATUS
- Publication number 20080314131
- Publication date Dec 25, 2008
- SII Nano Technology, Inc.
- Masatoshi Yasutake
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
POSITIONING APPARATUS AND SCANNING PROBE MICROSCOPE EMPLOYING THE SAME
- Publication number 20080295570
- Publication date Dec 4, 2008
- SII Nano Technology, Inc.
- Masafumi Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Piezoelectric actuator and scanning probe microscope using the same
- Publication number 20080023626
- Publication date Jan 31, 2008
- Masafumi Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and measuring method by means of the same
- Publication number 20050210966
- Publication date Sep 29, 2005
- Masafumi Watanabe
- G01 - MEASURING TESTING

Masafumi Watanabe

Person

Patents Grantslast 30 patents

Friction force microscope

Method of determining a spring constant of a cantilever and scannin...

Approach method for probe and sample in scanning probe microscope

Positioning apparatus and scanning probe microscope employing the same

Sample manipulating apparatus

Piezoelectric actuator and scanning probe microscope using the same

Scanning probe microscope and measuring method by means of the same

Patents Applicationslast 30 patents

PROBE SHAPE EVALUATION METHOD FOR A SCANNING PROBE MICROSCOPE

METHOD OF DETERMINING A SPRING CONSTANT OF A CANTILEVER AND SCANNIN...

FRICTION FORCE MICROSCOPE

APPROACH METHOD FOR PROBE AND SAMPLE IN SCANNING PROBE MICROSCOPE

SAMPLE MANIPULATING APPARATUS

POSITIONING APPARATUS AND SCANNING PROBE MICROSCOPE EMPLOYING THE SAME

Piezoelectric actuator and scanning probe microscope using the same

Scanning probe microscope and measuring method by means of the same