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Masaharu Horiguchi
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Naka-gun, JP
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last 30 patents
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Patent Grant
Polarization-independent reflectometry and polarization-independent...
Patent number
6,476,919
Issue date
Nov 5, 2002
Ando Electric Co., Ltd.
Tohru Mori
G01 - MEASURING TESTING
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Patent Grant
Preparation of silicon substrate
Patent number
6,402,973
Issue date
Jun 11, 2002
NTT Electronics Corp.
Yasushi Maeda
G02 - OPTICS