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Masaharu Nishida

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Patents Grantslast 30 patents

  • Information Patent Grant

    Display device, information terminal, personal information protecti...
    • Patent number 11,947,703
    • Issue date Apr 2, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Masaharu Nishida
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,719,714
    • Issue date Aug 8, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Abnormality determining method, and automatic analyzer
    • Patent number 11,714,095
    • Issue date Aug 1, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Hideto Tamezane
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,656,238
    • Issue date May 23, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,327,089
    • Issue date May 10, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Masafumi Shimada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,169,166
    • Issue date Nov 9, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Hideto Tamezane
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,605,817
    • Issue date Mar 31, 2020
    • Hitachi High-Technologies Corporation
    • Masaki Shiba
    • Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,288,637
    • Issue date May 14, 2019
    • Hitachi High-Technologies Corporation
    • Hideto Tamezane
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,151,766
    • Issue date Dec 11, 2018
    • Hitachi High-Technologies Corporation
    • Masaki Shiba
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,897,624
    • Issue date Feb 20, 2018
    • Hitachi High-Technologies Corporation
    • Hideto Tamezane
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,857,388
    • Issue date Jan 2, 2018
    • Hitachi High-Technologies Corporation
    • Hideto Tamezane
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,599,631
    • Issue date Mar 21, 2017
    • Hitachi High-Technologies Corporation
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Reagent transfer device
    • Patent number 9,513,302
    • Issue date Dec 6, 2016
    • Hitachi High-Technologies Corporation
    • Masaki Shiba
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Quality control system
    • Patent number 9,483,441
    • Issue date Nov 1, 2016
    • Hitachi High-Technologies Corporation
    • Qing Li
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Automatic analyzer and method for determining malfunction thereof
    • Patent number 9,470,570
    • Issue date Oct 18, 2016
    • Hitachi High-Technologies Corporation
    • Masaharu Nishida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer including pressure sensor for washing solution
    • Patent number 9,176,156
    • Issue date Nov 3, 2015
    • Hitachi High-Technologies Corporation
    • Shinji Azuma
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,158,058
    • Issue date Apr 17, 2012
    • Hitachi High-Technologies Corporation
    • Masaki Shiba
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Reagent cassette and automatic analyzer using the same
    • Patent number 7,887,751
    • Issue date Feb 15, 2011
    • Hitachi High-Technologies Corporation
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 7,776,264
    • Issue date Aug 17, 2010
    • Hitachi High-Technologies Corporation
    • Masaki Shiba
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 7,749,441
    • Issue date Jul 6, 2010
    • Hitachi High-Technologies Corporation
    • Masaaki Hanawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 7,727,469
    • Issue date Jun 1, 2010
    • Hitachi High-Technologies Corporation
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 7,547,414
    • Issue date Jun 16, 2009
    • Hitachi High-Technologies Corporation
    • Masaharu Nishida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 7,459,123
    • Issue date Dec 2, 2008
    • Hitachi High-Technologies Corporation
    • Tetsuya Isobe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 7,364,698
    • Issue date Apr 29, 2008
    • Hitachi High-Technologies Corporation
    • Takehiro Fujita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatically analyzing apparatus
    • Patent number 6,500,388
    • Issue date Dec 31, 2002
    • Hitachi, Ltd.
    • Yoshihiro Nagaoka
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ABNORMALITY DETERMINING METHOD, AND AUTOMATIC ANALYZER
    • Publication number 20210341502
    • Publication date Nov 4, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Hideto Tamezane
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Display Device, Information Terminal, Personal Information Protecti...
    • Publication number 20210312079
    • Publication date Oct 7, 2021
    • Hitachi High-Tech Corporation
    • Masaharu NISHIDA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20200264206
    • Publication date Aug 20, 2020
    • Hitachi High-Technologies Corporation
    • Sayaka SARWAR
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200041530
    • Publication date Feb 6, 2020
    • Hitachi High-Technologies Corporation
    • Masafumi SHIMADA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20190346468
    • Publication date Nov 14, 2019
    • Hitachi High-Technologies Corporation
    • Takashi NAKASAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20190072576
    • Publication date Mar 7, 2019
    • Masaki Shiba
    • Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Information Patent Application

    AUTOMATIC ANALYSER
    • Publication number 20180031589
    • Publication date Feb 1, 2018
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170089938
    • Publication date Mar 30, 2017
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170010292
    • Publication date Jan 12, 2017
    • Hitachi High-Technologies Corporation
    • Masaki SHIBA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150362514
    • Publication date Dec 17, 2015
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150323557
    • Publication date Nov 12, 2015
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140220693
    • Publication date Aug 7, 2014
    • Hitachi High-Technologies Corporation
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD FOR DETERMINING MALFUNCTION THEREOF
    • Publication number 20140190253
    • Publication date Jul 10, 2014
    • Hitachi High-Technologies Corporation
    • Masaharu Nishida
    • G01 - MEASURING TESTING
  • Information Patent Application

    QUALITY CONTROL SYSTEM
    • Publication number 20130151189
    • Publication date Jun 13, 2013
    • Hitachi High-Technologies Corporation
    • Qing Li
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20120183438
    • Publication date Jul 19, 2012
    • Hitachi High-Technologies Corporation
    • Masaki SHIBA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND ANALYSIS METHOD FOR USE IN THE SAME
    • Publication number 20120156801
    • Publication date Jun 21, 2012
    • Hitachi High-Technologies Corporation
    • Isao YAMAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20110174343
    • Publication date Jul 21, 2011
    • Hitachi High-Technologies Corporation
    • Shinji Azuma
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND ANALYSIS METHOD FOR USE IN THE SAME
    • Publication number 20090137048
    • Publication date May 28, 2009
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20080206097
    • Publication date Aug 28, 2008
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20050207938
    • Publication date Sep 22, 2005
    • Masaaki Hanawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20050175503
    • Publication date Aug 11, 2005
    • Masaki Shiba
    • G01 - MEASURING TESTING
  • Information Patent Application

    Reagent container
    • Publication number 20050142040
    • Publication date Jun 30, 2005
    • Masaaki Hanawa
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic analyzer
    • Publication number 20050135967
    • Publication date Jun 23, 2005
    • Tetsuya Isobe
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic analyzer and analysis for use in the same
    • Publication number 20050123446
    • Publication date Jun 9, 2005
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20050112025
    • Publication date May 26, 2005
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Reagent cassette and automatic analyzer using the same
    • Publication number 20050084426
    • Publication date Apr 21, 2005
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20050047964
    • Publication date Mar 3, 2005
    • Masaharu Nishida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040253146
    • Publication date Dec 16, 2004
    • Masaki Shiba
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040208787
    • Publication date Oct 21, 2004
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040186360
    • Publication date Sep 23, 2004
    • Hiroyuki Suzuki
    • G01 - MEASURING TESTING