Masaharu Tokiwa

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Hamamatsu, JP

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Patents Grantslast 30 patents

Information Patent Grant
Image acquisition device and image acquisition device focusing method
- Patent number 9,667,858
- Issue date May 30, 2017
- Hamamatsu Photonics K.K.
- Hideshi Oishi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Microscope and sample observation method
- Patent number 7,576,910
- Issue date Aug 18, 2009
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G01 - MEASURING TESTING
Information Patent Grant
Microscope and sample observation method
- Patent number 7,312,921
- Issue date Dec 25, 2007
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G01 - MEASURING TESTING
Information Patent Grant
Microscope and sample observation method
- Patent number 7,110,172
- Issue date Sep 19, 2006
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
IMAGE ACQUISITION DEVICE AND IMAGE ACQUISITION DEVICE FOCUSING METHOD
- Publication number 20160142617
- Publication date May 19, 2016
- Hamamatsu Photonics K.K.
- Hideshi OISHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Microscope and sample observation method
- Publication number 20080074739
- Publication date Mar 27, 2008
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G02 - OPTICS
Information Patent Application
Microscope and sample observation method
- Publication number 20060176548
- Publication date Aug 10, 2006
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G02 - OPTICS
Information Patent Application
Microscope and sample observation method
- Publication number 20050190436
- Publication date Sep 1, 2005
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G02 - OPTICS