Masahide Shima

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analysis method for obtaining XPS and AES and elements in each chem...
- Patent number 9,945,797
- Issue date Apr 17, 2018
- Jeol Ltd.
- Masahide Shima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Analysis Method and X-Ray Photoelectron Spectroscope
- Publication number 20170067837
- Publication date Mar 9, 2017
- JEOL Ltd.
- Masahide Shima
- G01 - MEASURING TESTING