Masahiko Iijima

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automated analyzer and automated analysis method
- Patent number 12,146,890
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 12,000,849
- Issue date Jun 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 11,971,425
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 11,971,426
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Rei Konishi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Adaptor for sample rack
- Patent number D1000634
- Issue date Oct 3, 2023
- HITACHI HIGH-TECH CORPORATION
- Takamichi Mori
- D24 - Medical and laboratory equipment
Information Patent Grant
Automatic analysis device
- Patent number 11,747,355
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Chie Yabutani
- G01 - MEASURING TESTING
Information Patent Grant
Sample cup
- Patent number D997383
- Issue date Aug 29, 2023
- HITACHI HIGH-TECH CORPORATION
- Takamichi Mori
- D24 - Medical and laboratory equipment
Information Patent Grant
Automatic analyzer and standard solution for evaluating scattered l...
- Patent number 11,692,929
- Issue date Jul 4, 2023
- HITACHI HIGH-TECH CORPORATION
- Sakuichiro Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 11,674,970
- Issue date Jun 13, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 11,231,432
- Issue date Jan 25, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroki Akase
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 11,209,448
- Issue date Dec 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer and automated analysis method
- Patent number 11,187,712
- Issue date Nov 30, 2021
- Hitachi High-Technologies Corporation
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 11,156,625
- Issue date Oct 26, 2021
- HITACHI HIGH-TECH CORPORATION
- Chie Yabutani
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 10,976,333
- Issue date Apr 13, 2021
- HITACHI HIGH-TECH CORPORATION
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and cleaning mechanism in automatic analy...
- Patent number 10,603,667
- Issue date Mar 31, 2020
- Hitachi High-Technologies Corporation
- Kei Shioya
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automatic analyzer
- Patent number 10,416,179
- Issue date Sep 17, 2019
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Clinical analyzer
- Patent number D849264
- Issue date May 21, 2019
- Hitachi High-Technologies Corporation
- Ai Masuda
- D24 - Medical and laboratory equipment
Information Patent Grant
Light shielding cover of a clinical analyzer
- Patent number D838381
- Issue date Jan 15, 2019
- Hitachi High-Technologies Corporation
- Ai Masuda
- D24 - Medical and laboratory equipment
Information Patent Grant
Automatic analyzer
- Patent number 9,696,329
- Issue date Jul 4, 2017
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 9,638,640
- Issue date May 2, 2017
- Hitachi High-Technologies Corporation
- Masahiko Iijima
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 9,575,082
- Issue date Feb 21, 2017
- Hitachi High-Technologies Corporation
- Sakuichiro Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device, and automatic analysis method
- Patent number 9,557,264
- Issue date Jan 31, 2017
- Hitachi High-Technologies Corporation
- Sakuichiro Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer and method for detecting measurement value abnor...
- Patent number 9,506,942
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 9,400,247
- Issue date Jul 26, 2016
- Hitachi High-Technologies Corporation
- Kotaro Yamashita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automatic Analyzer
- Publication number 20240345110
- Publication date Oct 17, 2024
- Hitachi High-Tech Corporation
- Hiromi Hirama
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND METHOD FOR CONTROLLING SAME
- Publication number 20240319221
- Publication date Sep 26, 2024
- HITACHI HIGH-TECH CORPORATION
- Airi SASAKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20240272186
- Publication date Aug 15, 2024
- HITACHI HIGH-TECH CORPORATION
- Akihisa MAKINO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20240272187
- Publication date Aug 15, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuto KAZAMA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CONTAINER AND AUTOMATIC ANALYZER
- Publication number 20240192238
- Publication date Jun 13, 2024
- HITACHI HIGH-TECH CORPORATION
- Akihito WAKUI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20230408537
- Publication date Dec 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analyzer, Recommended Action Notification System, and Rec...
- Publication number 20230375580
- Publication date Nov 23, 2023
- Hitachi High-Tech Corporation
- Aika NAKAJIMA
- G01 - MEASURING TESTING
Information Patent Application
DATA PROCESSING DEVICE AND AUTOMATIC ANALYZER
- Publication number 20230375581
- Publication date Nov 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Nozomi SAGAE
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20230266352
- Publication date Aug 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuto KAZAMA
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analysis Device
- Publication number 20230069039
- Publication date Mar 2, 2023
- Hitachi High-Tech Corporation
- Tomotada OOTAKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20220326270
- Publication date Oct 13, 2022
- HITACHI HIGH-TECH CORPORATION
- Miki FURUYA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20220074959
- Publication date Mar 10, 2022
- HITACHI HIGH-TECH CORPORATION
- Akihisa MAKINO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20220003794
- Publication date Jan 6, 2022
- HITACHI HIGH-TECH CORPORATION
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
Automated Analyzer and Automated Analysis Method
- Publication number 20210405079
- Publication date Dec 30, 2021
- Hitachi High-Technologies Corporation
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20210190806
- Publication date Jun 24, 2021
- HITACHI HIGH-TECH CORPORATION
- Yuto KAZAMA
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analysis Device
- Publication number 20200278366
- Publication date Sep 3, 2020
- Hitachi High-Technologies Corporation
- Rei KONISHI
- G01 - MEASURING TESTING
Information Patent Application
Automated Analyzer and Automated Analysis Method
- Publication number 20200271677
- Publication date Aug 27, 2020
- Hitachi High-Technologies Corporation
- Yuto KAZAMA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20200241024
- Publication date Jul 30, 2020
- Hitachi High-Technologies Corporation
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20190369131
- Publication date Dec 5, 2019
- Hitachi High-Technologies Corporation
- Hiroki AKASE
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analysis Device and Cleaning Mechanism in Automatic Analy...
- Publication number 20190351424
- Publication date Nov 21, 2019
- Hitachi High-Technologies Corporation
- Kei SHIOYA
- B08 - CLEANING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20190346470
- Publication date Nov 14, 2019
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20190162744
- Publication date May 30, 2019
- Hitachi High-Technologies Corporation
- Yuto KAZAMA
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analyzer and Standard Solution for Evaluating Scattered L...
- Publication number 20190025192
- Publication date Jan 24, 2019
- Hitachi High-Technologies Corporation
- Sakuichiro ADACHI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20170269113
- Publication date Sep 21, 2017
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20160077119
- Publication date Mar 17, 2016
- Hitachi High-Technologies Corporation
- Sakuichiro ADACHI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE, AND AUTOMATIC ANALYSIS METHOD
- Publication number 20150219556
- Publication date Aug 6, 2015
- Hitachi High-Technologies Corporation
- Sakuichiro Adachi
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYER
- Publication number 20150204794
- Publication date Jul 23, 2015
- Hitachi High-Technologies Corporation
- Masahiko Iijima
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20150104351
- Publication date Apr 16, 2015
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYER
- Publication number 20150033831
- Publication date Feb 5, 2015
- Hitachi High-Technologies Corporation
- Kotaro Yamashita
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER AND METHOD FOR DETECTING MEASUREMENT VALUE ABNOR...
- Publication number 20140356964
- Publication date Dec 4, 2014
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING

Masahiko Iijima

Person

Patents Grantslast 30 patents

Automated analyzer and automated analysis method

Automatic analyzer

Automatic analysis device and automatic analysis method

Automatic analysis device

Adaptor for sample rack

Automatic analysis device

Sample cup

Automatic analyzer and standard solution for evaluating scattered l...

Automatic analysis device and automatic analysis method

Automatic analysis device and automatic analysis method

Automatic analyzer

Automated analyzer and automated analysis method

Automatic analysis device

Automatic analysis device and automatic analysis method

Automatic analysis device and cleaning mechanism in automatic analy...

Automatic analyzer

Clinical analyzer

Light shielding cover of a clinical analyzer

Automatic analyzer

Automatic analyzer

Automatic analysis device and automatic analysis method

Automatic analysis device, and automatic analysis method

Automatic analyzer and method for detecting measurement value abnor...

Automatic analyzer

Patents Applicationslast 30 patents

Automatic Analyzer

AUTOMATIC ANALYSIS DEVICE AND METHOD FOR CONTROLLING SAME

AUTOMATIC ANALYZER

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

SAMPLE CONTAINER AND AUTOMATIC ANALYZER

AUTOMATIC ANALYSIS DEVICE

Automatic Analyzer, Recommended Action Notification System, and Rec...

DATA PROCESSING DEVICE AND AUTOMATIC ANALYZER

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Automatic Analysis Device

AUTOMATIC ANALYSIS DEVICE

AUTOMATIC ANALYZER

AUTOMATIC ANALYSIS DEVICE

Automated Analyzer and Automated Analysis Method

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Automatic Analysis Device

Automated Analyzer and Automated Analysis Method

AUTOMATIC ANALYSIS DEVICE

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Automatic Analysis Device and Cleaning Mechanism in Automatic Analy...

AUTOMATIC ANALYZER

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Automatic Analyzer and Standard Solution for Evaluating Scattered L...

AUTOMATIC ANALYZER

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

AUTOMATIC ANALYSIS DEVICE, AND AUTOMATIC ANALYSIS METHOD

AUTOMATIC ANALYER

AUTOMATIC ANALYZER

AUTOMATIC ANALYER

AUTOMATIC ANALYZER AND METHOD FOR DETECTING MEASUREMENT VALUE ABNOR...