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Masahiko Kawamura
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Yokohama, JP
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last 30 patents
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Patent Grant
Semiconductor integrated circuit devices and methods for testing same
Patent number
4,881,029
Issue date
Nov 14, 1989
Kabushiki Kaisha Toshiba
Masahiko Kawamura
G01 - MEASURING TESTING
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Patent Grant
Semiconductor integrated circuit device
Patent number
4,631,686
Issue date
Dec 23, 1986
Kabushiki Kaisha Toshiba
Yasuo Ikawa
H03 - BASIC ELECTRONIC CIRCUITRY