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Masahiko Kimura
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Kodaira, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor integrated circuit and a method of testing the same
Patent number
7,467,339
Issue date
Dec 16, 2008
Renesas Technology Corporation
Toshihiro Tanaka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor integrated circuit and a method of testing the same
Patent number
7,447,959
Issue date
Nov 4, 2008
Renesas Technology Corp.
Toshihiro Tanaka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor integrated circuit and a method of testing the same
Patent number
7,000,160
Issue date
Feb 14, 2006
Renesas Technology Corp.
Toshihiro Tanaka
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
Semiconductor integrated circuit and a method of testing the same
Publication number
20070288817
Publication date
Dec 13, 2007
Toshihiro Tanaka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor integrated circuit and a method of testing the same
Publication number
20060123299
Publication date
Jun 8, 2006
RENESAS TECHNOLOGY CORP.
Toshihiro Tanaka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor integrated circuit and a method of testing the same
Publication number
20020153917
Publication date
Oct 24, 2002
Hitachi, Ltd.
Toshihiro Tanaka
G01 - MEASURING TESTING