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Probe needle
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Patent number 5,532,613
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Issue date Jul 2, 1996
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Tokyo Electron Kabushiki Kaisha
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Yasushi Nagasawa
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G01 - MEASURING TESTING
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Plasma processing apparatus
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Patent number 5,252,892
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Issue date Oct 12, 1993
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Tokyo Electron Limited
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Akira Koshiishi
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H01 - BASIC ELECTRIC ELEMENTS
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Ion generator
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Patent number 5,101,110
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Issue date Mar 31, 1992
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Tokyo Electron Limited
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Masahiko Matsudo
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H01 - BASIC ELECTRIC ELEMENTS
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Ion implantation equipment
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Patent number 5,089,710
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Issue date Feb 18, 1992
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Tokyo Electron Limited
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Shuji Kikuchi
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H01 - BASIC ELECTRIC ELEMENTS
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Electron generating apparatus
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Patent number 5,049,784
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Issue date Sep 17, 1991
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Tokyo Electron Limited
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Masahiko Matsudo
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H01 - BASIC ELECTRIC ELEMENTS
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