Masahiko Nagao

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Visual inspection method and visual inspection apparatus
- Patent number 7,664,306
- Issue date Feb 16, 2010
- NEC Electronics Corporation
- Yoshihiro Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Visual inspection method and visual inspection apparatus
- Patent number 7,545,970
- Issue date Jun 9, 2009
- NEC Electronics Corporation
- Yoshihiro Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection apparatus and method in which plural threads...
- Patent number 6,987,894
- Issue date Jan 17, 2006
- NEC Electronics Corporation
- Yoshihiro Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting semiconductor integrated circuit which can qui...
- Patent number 6,954,274
- Issue date Oct 11, 2005
- NEC Electronics Corporation
- Yoshihiro Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Visual inspection method and visual inspection apparatus
- Patent number 6,950,549
- Issue date Sep 27, 2005
- NEC Electronics Corporation
- Yoshihiro Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection method and appearance inspection apparatus ha...
- Patent number 6,741,734
- Issue date May 25, 2004
- NEC Corporation
- Yoshihiro Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
VISUAL INSPECTION METHOD FOR ELECTRONIC DEVICE, VISUAL INSPECTING A...
- Patent number 6,597,805
- Issue date Jul 22, 2003
- NEC Corporation
- Masahiko Nagao
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
VISUAL INSPECTION METHOD AND VISUAL INSPECTION APPARATUS
- Publication number 20090202141
- Publication date Aug 13, 2009
- NEC ELECTRONICS CORPORATION
- Yoshihiro SASAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Visual inspection method and visual inspection apparatus
- Publication number 20050276463
- Publication date Dec 15, 2005
- NEC ELECTRONICS CORPORATION
- Yoshihiro Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image data processing unit for use in a visual inspection device
- Publication number 20030228066
- Publication date Dec 11, 2003
- NEC Corporation
- Yasushi Tomita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of inspecting semiconductor integrated circuit which can qui...
- Publication number 20020140949
- Publication date Oct 3, 2002
- NEC Corporation
- Yoshihiro Sasaki
- G01 - MEASURING TESTING
Information Patent Application
Visual inspection method and visual inspection apparatus
- Publication number 20020110271
- Publication date Aug 15, 2002
- NEC Corporation
- Yoshihiro Sasaki
- G01 - MEASURING TESTING
Information Patent Application
Appearance inspection apparatus and appearance inspection method
- Publication number 20010042065
- Publication date Nov 15, 2001
- NEC Corporation
- Yoshihiro Sasaki
- G01 - MEASURING TESTING
Information Patent Application
Appearance inspection method and appearance inspection apparatus ha...
- Publication number 20010028733
- Publication date Oct 11, 2001
- Yoshihiro Sasaki
- G01 - MEASURING TESTING

Masahiko Nagao

Person

Patents Grantslast 30 patents

Visual inspection method and visual inspection apparatus

Visual inspection method and visual inspection apparatus

Appearance inspection apparatus and method in which plural threads...

Method of inspecting semiconductor integrated circuit which can qui...

Visual inspection method and visual inspection apparatus

Appearance inspection method and appearance inspection apparatus ha...

VISUAL INSPECTION METHOD FOR ELECTRONIC DEVICE, VISUAL INSPECTING A...

Patents Applicationslast 30 patents

VISUAL INSPECTION METHOD AND VISUAL INSPECTION APPARATUS

Visual inspection method and visual inspection apparatus

Image data processing unit for use in a visual inspection device

Method of inspecting semiconductor integrated circuit which can qui...

Visual inspection method and visual inspection apparatus

Appearance inspection apparatus and appearance inspection method

Appearance inspection method and appearance inspection apparatus ha...