Masahiko Sakurai

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Burn-in socket used in a burn-in test for semiconductor chips
- Patent number 5,523,586
- Issue date Jun 4, 1996
- Kabushiki Kaisha Toshiba
- Masahiko Sakurai
- G01 - MEASURING TESTING