Masahiko Tachikake

Person

Kure, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inside diameter measuring tool
- Patent number 8,033,032
- Issue date Oct 11, 2011
- Mitutoyo Corporation
- Yuji Fujikawa
- G01 - MEASURING TESTING
Information Patent Grant
Digital displacement measuring instrument
- Patent number 8,001,698
- Issue date Aug 23, 2011
- Mitutoyo Corporation
- Shuji Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Digital displacement measuring instrument
- Patent number 7,877,894
- Issue date Feb 1, 2011
- Mitutoyo Corporation
- Shuji Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Micrometer
- Patent number D584177
- Issue date Jan 6, 2009
- Mitutoyo Corporation
- Shigeru Ohtani
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Measuring device using multi-start threaded spindle
- Patent number 7,013,576
- Issue date Mar 21, 2006
- Mitutoyo Corporation
- Shuuji Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instruments
- Patent number 6,553,685
- Issue date Apr 29, 2003
- Mitutoyo Corporation
- Shingo Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Micrometer that holds displayed displacement when retraction amount...
- Patent number 6,308,433
- Issue date Oct 30, 2001
- Mitutoyo Corporation
- Seigo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Micrometer
- Patent number 5,829,155
- Issue date Nov 3, 1998
- Mitutoyo Corporation
- Seigo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Digital display micrometer gauge
- Patent number 5,495,677
- Issue date Mar 5, 1996
- Mitutoyo Corporation
- Masahiko Tachikake
- G01 - MEASURING TESTING
Information Patent Grant
Linear displacement measuring apparatus
- Patent number 5,433,016
- Issue date Jul 18, 1995
- Mitutoyo Corporation
- Masahiko Tachikake
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIGITAL DISPLACEMENT MEASURING INSTRUMENT
- Publication number 20100024237
- Publication date Feb 4, 2010
- Mitutoyo Corporation
- Shuji Hayashida
- G01 - MEASURING TESTING
Information Patent Application
INSIDE DIAMETER MEASURING TOOL
- Publication number 20100005676
- Publication date Jan 14, 2010
- Mitutoyo Corporation
- Yuji Fujikawa
- G01 - MEASURING TESTING
Information Patent Application
Digital displacement measuring instrument
- Publication number 20090282689
- Publication date Nov 19, 2009
- Mitutoyo Corporation
- Shuji Hayashida
- G01 - MEASURING TESTING
Information Patent Application
Measuring device
- Publication number 20030121169
- Publication date Jul 3, 2003
- Mitutoyo Corporation
- Shuuji Hayashida
- G01 - MEASURING TESTING
Information Patent Application
Measuring instruments
- Publication number 20020017032
- Publication date Feb 14, 2002
- Mitutoyo Corporation
- Shingo Nishina
- G01 - MEASURING TESTING

Masahiko Tachikake

Person

Patents Grantslast 30 patents

Inside diameter measuring tool

Digital displacement measuring instrument

Digital displacement measuring instrument

Micrometer

Measuring device using multi-start threaded spindle

Measuring instruments

Micrometer that holds displayed displacement when retraction amount...

Micrometer

Digital display micrometer gauge

Linear displacement measuring apparatus

Patents Applicationslast 30 patents

DIGITAL DISPLACEMENT MEASURING INSTRUMENT

INSIDE DIAMETER MEASURING TOOL

Digital displacement measuring instrument

Measuring device

Measuring instruments