Masahiko TAKIKAWA

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor switch
- Patent number 9,584,114
- Issue date Feb 28, 2017
- Advantest Corporation
- Yoshiyuki Hata
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Switch apparatus and test apparatus
- Patent number 9,184,741
- Issue date Nov 10, 2015
- Advantest Corporation
- Yoshiyuki Hata
- G01 - MEASURING TESTING
Information Patent Grant
Switching apparatus and test apparatus
- Patent number 8,552,735
- Issue date Oct 8, 2013
- Advantest Corporation
- Yoshiyuki Hata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, method for manufacturing of semiconductor dev...
- Patent number 8,466,566
- Issue date Jun 18, 2013
- Advantest Corporation
- Makoto Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR SWITCH
- Publication number 20160020765
- Publication date Jan 21, 2016
- Advantest Corporation
- Yoshiyuki HATA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DRIVE CIRCUIT, SWITCH APPARATUS, AND TEST APPARATUS
- Publication number 20140361790
- Publication date Dec 11, 2014
- Advantest Corporation
- Makoto NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
SWITCH APPARATUS AND TEST APPARATUS
- Publication number 20140002105
- Publication date Jan 2, 2014
- Advantest Corporation
- Yoshiyuki HATA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING OF SEMICONDUCTOR DEV...
- Publication number 20120074577
- Publication date Mar 29, 2012
- Advantest Corporation
- Makoto Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCHING APPARATUS AND TEST APPARATUS
- Publication number 20110316554
- Publication date Dec 29, 2011
- Advantest Corporation
- Yoshiyuki HATA
- G01 - MEASURING TESTING