Masahiko Yomoto

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Urayasu, JP

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Patents Grantslast 30 patents

Information Patent Grant
Flatness measuring apparatus
- Patent number 6,323,952
- Issue date Nov 27, 2001
- Nikon Corporation
- Masahiko Yomoto
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring temperature of semiconductor substrate and app...
- Patent number 4,890,245
- Issue date Dec 26, 1989
- Nikon Corporation
- Masahiko Yomoto
- G01 - MEASURING TESTING
Information Patent Grant
Light radiation apparatus
- Patent number 4,859,832
- Issue date Aug 22, 1989
- Nikon Corporation
- Makoto Uehara
- H01 - BASIC ELECTRIC ELEMENTS