Masahiro HATO

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Damage evaluation device and damage evaluation method
- Patent number 12,105,050
- Issue date Oct 1, 2024
- IHI Corporation
- Yuuki Nagai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THICKNESS MEASUREMENT DEVICE AND THICKNESS MEASUREMENT METHOD
- Publication number 20230273017
- Publication date Aug 31, 2023
- IHI Corporation
- Seiichi OHMORI
- G01 - MEASURING TESTING
Information Patent Application
DAMAGE EVALUATION DEVICE AND DAMAGE EVALUATION METHOD
- Publication number 20220381741
- Publication date Dec 1, 2022
- IHI Corporation
- Yuuki NAGAI
- G01 - MEASURING TESTING