Masahiro Horie

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Suwon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Surface inspecting method
- Patent number 10,001,444
- Issue date Jun 19, 2018
- Samsung Electronics Co., Ltd.
- Kang-woong Ko
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting overlay error and method for manufacturing sem...
- Patent number 9,841,688
- Issue date Dec 12, 2017
- Samsung Electronics Co., Ltd.
- Kang-Woong Ko
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF INSPECTING SUBSTRATES AND SEMICONDUCTOR FABRICATION METH...
- Publication number 20170200658
- Publication date Jul 13, 2017
- Samsung Electronics Co., Ltd.
- Yusin Yang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING OVERLAY ERROR AND METHOD FOR MANUFACTURING SEM...
- Publication number 20160300767
- Publication date Oct 13, 2016
- Kang-Woong Ko
- G01 - MEASURING TESTING
Information Patent Application
Surface Inspecting Method
- Publication number 20160153915
- Publication date Jun 2, 2016
- Samsung Electronics Co., Ltd.
- Kang-woong Ko
- G01 - MEASURING TESTING