Masahiro Inui

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Oxide film thickness measurement device and method
- Patent number 11,852,458
- Issue date Dec 26, 2023
- Kobe Steel, Ltd.
- Masahiro Inui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Device and method for measuring oxide film thickness
- Patent number 11,761,752
- Issue date Sep 19, 2023
- Kobe Steel, Ltd.
- Masahiro Inui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Crystalline quality evaluation apparatus for thin-film semiconducto...
- Patent number 8,952,338
- Issue date Feb 10, 2015
- Kobe Steel, Ltd.
- Naokazu Sakoda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PRODUCING HOT-ROLLED STEEL SHEET, METHOD FOR PREDICTING...
- Publication number 20240167117
- Publication date May 23, 2024
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Koki FUKUSHIMA
- C21 - METALLURGY OF IRON
Information Patent Application
OXIDE FILM THICKNESS MEASUREMENT DEVICE AND METHOD
- Publication number 20210356253
- Publication date Nov 18, 2021
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Masahiro INUI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING OXIDE FILM THICKNESS
- Publication number 20210356254
- Publication date Nov 18, 2021
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Masahiro INUI
- G01 - MEASURING TESTING
Information Patent Application
CRYSTALLINE QUALITY EVALUATION APPARATUS FOR THIN-FILM SEMICONDUCTO...
- Publication number 20130153778
- Publication date Jun 20, 2013
- KOBELCO RESEARCH INSTITUTE, INC.
- Naokazu Sakoda
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME
- Publication number 20120203473
- Publication date Aug 9, 2012
- KOBELCO RESEARCH INSTITUTE, INC.
- Kazushi Hayashi
- G01 - MEASURING TESTING