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TOKYO, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Measurement circuit and test apparatus
Patent number
7,521,937
Issue date
Apr 21, 2009
Advantest Corporation
Masahiro Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Electric power applying circuit and test apparatus
Patent number
7,482,829
Issue date
Jan 27, 2009
Advantest Corporation
Kazunari Hirata
G01 - MEASURING TESTING
Information
Patent Grant
Image forming apparatus and method for obtaining smooth charging, e...
Patent number
5,483,272
Issue date
Jan 9, 1996
Kyocera Corporation
Hisashi Mukataka
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
POWER SUPPLY, TEST APPARATUS, AND CONTROL METHOD
Publication number
20110062920
Publication date
Mar 17, 2011
Advantest Corporation
Masahiro NAGATA
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT CIRCUIT AND TEST APPARATUS
Publication number
20070268022
Publication date
Nov 22, 2007
Advantest Corporation
MASAHIRO NAGATA
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC POWER APPLYING CIRCUIT AND TEST APPARATUS
Publication number
20070252571
Publication date
Nov 1, 2007
Advantest Corporation
KAZUNARI HIRATA
G01 - MEASURING TESTING