Masahiro Nakajo

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Hirakata, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for evaluating aberrations of optical element...
- Patent number 6,809,829
- Issue date Oct 26, 2004
- Matsushita Electric Industrial Co., Ltd.
- Kazumasa Takata
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating aberrations of optical element...
- Patent number 6,538,749
- Issue date Mar 25, 2003
- Matsushita Electric Industrial Co., Ltd.
- Kazumasa Takata
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for surface inspection
- Patent number 5,920,387
- Issue date Jul 6, 1999
- Matsushita Electric Industrial Co., Ltd.
- Masahiro Nakajo
- G01 - MEASURING TESTING