Masahiro Ohta

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope
- Patent number 10,955,436
- Issue date Mar 23, 2021
- Shimadzu Corporation
- Masahiro Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,802,044
- Issue date Oct 13, 2020
- Shimadzu Corporation
- Masahiro Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Data display processing device, data display processing method and...
- Patent number 10,175,264
- Issue date Jan 8, 2019
- Shimadzu Corporation
- Hiroshi Arai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning probe microscope
- Patent number 9,395,387
- Issue date Jul 19, 2016
- Shimadzu Corporation
- Masahiro Ohta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scan device for microscope measurement instrument
- Patent number 8,796,654
- Issue date Aug 5, 2014
- Shimadzu Coporation
- Masahiro Ohta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 7,391,022
- Issue date Jun 24, 2008
- Shimadzu Corporation
- Masahiro Ohta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20200003800
- Publication date Jan 2, 2020
- Shimadzu Corporation
- Masahiro OHTA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20180299480
- Publication date Oct 18, 2018
- Shimadzu Corporation
- Masahiro OHTA
- G01 - MEASURING TESTING
Information Patent Application
DATA DISPLAY PROCESSING DEVICE, DATA DISPLAY PROCESSING METHOD AND...
- Publication number 20170322234
- Publication date Nov 9, 2017
- SHIMADZU CORPORATION
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
Scan Device
- Publication number 20110261352
- Publication date Oct 27, 2011
- SHIMADZU CORPORATION
- Masahiro Ohta
- G01 - MEASURING TESTING