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Masahiro Oshio
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Suwa-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Vibration element, physical quantity sensor, inertial measurement u...
Patent number
11,888,464
Issue date
Jan 30, 2024
Seiko Epson Corporation
Seiichiro Ogura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Vibration element, manufacturing method of vibration element, physi...
Patent number
11,595,026
Issue date
Feb 28, 2023
Seiko Epson Corporation
Seiichiro Ogura
G01 - MEASURING TESTING
Information
Patent Grant
Vibrator device
Patent number
11,287,260
Issue date
Mar 29, 2022
Seiko Epson Corporation
Masahiro Oshio
G01 - MEASURING TESTING
Information
Patent Grant
Frequency adjustment method of vibrator element
Patent number
11,239,407
Issue date
Feb 1, 2022
Seiko Epson Corporation
Keiichi Yamaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Frequency adjustment method of vibration element, manufacturing met...
Patent number
11,085,765
Issue date
Aug 10, 2021
Seiko Epson Corporation
Shogo Sasaki
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Vibration element, manufacturing method of vibration element, physi...
Patent number
11,025,222
Issue date
Jun 1, 2021
Seiko Epson Corporation
Seiichiro Ogura
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensor element control device, inertial sensor, electronic...
Patent number
10,823,747
Issue date
Nov 3, 2020
Seiko Epson Corporation
Masahiro Oshio
G01 - MEASURING TESTING
Information
Patent Grant
Circuit for physical quantity sensor, physical quantity sensor, and...
Patent number
10,101,158
Issue date
Oct 16, 2018
Seiko Epson Corporation
Masahiro Oshio
G01 - MEASURING TESTING
Information
Patent Grant
Method for inspecting physical quantity sensor and method for manuf...
Patent number
10,041,796
Issue date
Aug 7, 2018
Seiko Epson Corporation
Masahiro Oshio
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, electronic device, and moving object
Patent number
9,863,972
Issue date
Jan 9, 2018
Seiko Epson Corporation
Takehiko Shindo
G01 - MEASURING TESTING
Information
Patent Grant
Signal processing circuit, physical quantity detection apparatus, a...
Patent number
9,046,366
Issue date
Jun 2, 2015
Seiko Epson Corporation
Yoshinao Yanagisawa
G01 - MEASURING TESTING
Information
Patent Grant
Detection circuit, physical quantity detection apparatus, angular v...
Patent number
8,850,887
Issue date
Oct 7, 2014
Seiko Epson Corporation
Yoshinao Yanagisawa
G01 - MEASURING TESTING
Information
Patent Grant
Composite sensor and electronic device
Patent number
8,733,169
Issue date
May 27, 2014
Seiko Epson Corporation
Masahiro Oshio
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibrating element, vibrator, and electronic apparatus
Patent number
8,640,540
Issue date
Feb 4, 2014
Seiko Epson Corporation
Masahiro Oshio
G01 - MEASURING TESTING
Information
Patent Grant
Angular velocity detection apparatus
Patent number
8,618,890
Issue date
Dec 31, 2013
Seiko Epson Corporation
Yoshinao Yanagisawa
G01 - MEASURING TESTING
Information
Patent Grant
Acceleration sensor and electronic device
Patent number
8,573,058
Issue date
Nov 5, 2013
Seiko Epson Corporation
Masahiro Oshio
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibrating reed, vibrator, physical quantity sensor, and electronic...
Patent number
8,453,503
Issue date
Jun 4, 2013
Seiko Epson Corporation
Masahiro Oshio
G01 - MEASURING TESTING
Information
Patent Grant
Composite sensor and electronic device
Patent number
8,342,021
Issue date
Jan 1, 2013
Seiko Epson Corporation
Masahiro Oshio
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Tuning fork oscillating piece, tuning fork oscillator, and accelera...
Patent number
8,004,165
Issue date
Aug 23, 2011
Seiko Epson Corporation
Makoto Furuhata
G01 - MEASURING TESTING
Information
Patent Grant
Resonator SAW filter having a control interdigital transducer betwe...
Patent number
7,579,932
Issue date
Aug 25, 2009
Seiko Epson Corporation
Michiaki Takagi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Surface acoustic wave device, method of manufacturing the same, and...
Patent number
7,474,033
Issue date
Jan 6, 2009
Seiko Epson Corporation
Masahiro Oshio
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Surface-acoustic wave device and method of manufacturing same
Patent number
7,336,016
Issue date
Feb 26, 2008
Seiko Epson Corporation
Masahiro Oshio
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Frequency adjustment method of surface acoustic wave device, surfac...
Patent number
7,283,021
Issue date
Oct 16, 2007
Seiko Epson Corporation
Masahiro Oshio
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of controlling frequency of surface acoustic wave device and...
Patent number
6,972,642
Issue date
Dec 6, 2005
Seiko Epson Corporation
Masahiro Oshio
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Longitudinal double-mode saw filter utilizing electrode finger phas...
Patent number
6,937,116
Issue date
Aug 30, 2005
Seiko Epson Corporation
Michiaki Takagi
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
Vibration Element, Manufacturing Method of Vibration Element, Physi...
Publication number
20230387885
Publication date
Nov 30, 2023
SEIKO EPSON CORPORATION
Seiichiro OGURA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Vibration Element, Physical Quantity Sensor, Inertial Measurement U...
Publication number
20230109944
Publication date
Apr 13, 2023
SEIKO EPSON CORPORATION
Seiichiro OGURA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Vibration Element, Manufacturing Method Of Vibration Element, Physi...
Publication number
20210313959
Publication date
Oct 7, 2021
SEIKO EPSON CORPORATION
Seiichiro OGURA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Vibrator Device
Publication number
20210063156
Publication date
Mar 4, 2021
SEIKO EPSON CORPORATION
Masahiro OSHIO
G01 - MEASURING TESTING
Information
Patent Application
VIBRATING ELEMENT, PHYSICAL QUANTITY SENSOR, INERTIAL MEASUREMENT D...
Publication number
20190301867
Publication date
Oct 3, 2019
SEIKO EPSON CORPORATION
Shogo SASAKI
G01 - MEASURING TESTING
Information
Patent Application
Frequency Adjustment Method Of Vibration Element, Manufacturing Met...
Publication number
20190301869
Publication date
Oct 3, 2019
SEIKO EPSON CORPORATION
Shogo SASAKI
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Vibration Element, Manufacturing Method Of Vibration Element, Physi...
Publication number
20190229706
Publication date
Jul 25, 2019
SEIKO EPSON CORPORATION
Seiichiro OGURA
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY ADJUSTMENT METHOD OF VIBRATOR ELEMENT, VIBRATOR ELEMENT,...
Publication number
20190006575
Publication date
Jan 3, 2019
SEIKO EPSON CORPORATION
Keiichi YAMAGUCHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INERTIAL SENSOR ELEMENT CONTROL DEVICE, INERTIAL SENSOR, ELECTRONIC...
Publication number
20180313864
Publication date
Nov 1, 2018
SEIKO EPSON CORPORATION
Masahiro OSHIO
G01 - MEASURING TESTING
Information
Patent Application
Circuit for Physical Quantity Sensor, Physical Quantity Sensor, and...
Publication number
20160313124
Publication date
Oct 27, 2016
SEIKO EPSON CORPORATION
Masahiro Oshio
G01 - MEASURING TESTING
Information
Patent Application
Method for inspecting Physical Quantity Sensor and Method for Manuf...
Publication number
20160290828
Publication date
Oct 6, 2016
SEIKO EPSON CORPORATION
Masahiro Oshio
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL QUANTITY SENSOR, ELECTRONIC DEVICE, AND MOVING OBJECT
Publication number
20140290363
Publication date
Oct 2, 2014
SEIKO EPSON CORPORATION
Takehiko SHINDO
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITE SENSOR AND ELECTRONIC DEVICE
Publication number
20130081462
Publication date
Apr 4, 2013
SEIKO EPSON CORPORATION
Masahiro OSHIO
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DRIVER CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, ANGULAR VELO...
Publication number
20130057354
Publication date
Mar 7, 2013
SEIKO NPC CORPORATION
Yoshinao YANAGISAWA
G01 - MEASURING TESTING
Information
Patent Application
DETECTION CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, ANGULAR V...
Publication number
20130055810
Publication date
Mar 7, 2013
SEIKO NPC CORPORATION
Yoshinao YANAGISAWA
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL PROCESSING CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, A...
Publication number
20130055815
Publication date
Mar 7, 2013
SEIKO NPC CORPORATION
Yoshinao YANAGISAWA
G01 - MEASURING TESTING
Information
Patent Application
VIBRATING ELEMENT, VIBRATOR, AND ELECTRONIC APPARATUS
Publication number
20110162450
Publication date
Jul 7, 2011
SEIKO EPSON CORPORATION
Masahiro OSHIO
G01 - MEASURING TESTING
Information
Patent Application
VIBRATING REED, VIBRATOR, PHYSICAL QUANTITY SENSOR, AND ELECTRONIC...
Publication number
20110138911
Publication date
Jun 16, 2011
SEIKO EPSON CORPORATION
Masahiro OSHIO
G01 - MEASURING TESTING
Information
Patent Application
ACCELERATION SENSOR AND ELECTRONIC DEVICE
Publication number
20100212426
Publication date
Aug 26, 2010
SEIKO EPSON CORPORATION
Masahiro OSHIO
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
COMPOSITE SENSOR AND ELECTRONIC DEVICE
Publication number
20100206075
Publication date
Aug 19, 2010
SEIKO EPSON CORPORATION
Masahiro OSHIO
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
TUNING FORK OSCILLATING PIECE, TUNING FORK OSCILLATOR, AND ACCELERA...
Publication number
20090058226
Publication date
Mar 5, 2009
SEIKO EPSON CORPORATION
Makoto Furuhata
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Resonator Saw Filter
Publication number
20080018416
Publication date
Jan 24, 2008
SEIKO EPSON CORPORATION
Michiaki Takagi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Frequency adjustment method of surface acoustic wave device, surfac...
Publication number
20050275487
Publication date
Dec 15, 2005
SEIKO EPSON CORPORATION
Masahiro Oshio
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Surface acoustic wave device, method of manufacturing the same, and...
Publication number
20050275309
Publication date
Dec 15, 2005
SEIKO EPSON CORPORATION
Masahiro Oshio
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Surface acoustic wave element and electronic equipment
Publication number
20050122188
Publication date
Jun 9, 2005
Tsukasa Funasaka
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Surface acoustic wave device and method of manufacturing same
Publication number
20050062560
Publication date
Mar 24, 2005
SEIKO EPSON CORPORATION
Masahiro Oshio
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Longitudinal double-mode saw filter
Publication number
20040212455
Publication date
Oct 28, 2004
SEIKO EPSON CORPORATION
Michiaki Takagi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Method of controlling frequency of surface acoustic wave device and...
Publication number
20040164821
Publication date
Aug 26, 2004
SEIKO EPSON CORPORATION
Masahiro Oshio
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Surface acoustic wave device, method of manufacturing the same, and...
Publication number
20040164645
Publication date
Aug 26, 2004
SEIKO EPSON CORPORATION
Masahiro Oshio
H03 - BASIC ELECTRONIC CIRCUITRY