Masahiro Sameshima

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Double-sided probe systems with thermal control systems and related...
- Patent number 11,378,619
- Issue date Jul 5, 2022
- FormFactor, Inc.
- Masahiro Sameshima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DOUBLE-SIDED PROBE SYSTEMS WITH THERMAL CONTROL SYSTEMS AND RELATED...
- Publication number 20210190860
- Publication date Jun 24, 2021
- FormFactor, Inc.
- Masahiro Sameshima
- G01 - MEASURING TESTING
Information Patent Application
CUSTOMIZABLE PROBE CARDS, PROBE SYSTEMS INCLUDING THE SAME, AND REL...
- Publication number 20210172978
- Publication date Jun 10, 2021
- FormFactor Beaverton, Inc.
- Yoichi Funatoko
- G01 - MEASURING TESTING