Masahiro Tsugai

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Capacitance-type inertial detecting device
- Patent number 6,997,054
- Issue date Feb 14, 2006
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Tsugai
- G01 - MEASURING TESTING
Information Patent Grant
Acceleration sensor
- Patent number 6,955,086
- Issue date Oct 18, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Eiji Yoshikawa
- G01 - MEASURING TESTING
Information Patent Grant
Angular velocity sensor
- Patent number 6,584,840
- Issue date Jul 1, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Tsugai
- G01 - MEASURING TESTING
Information Patent Grant
Angular rate sensor
- Patent number 6,494,094
- Issue date Dec 17, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Tsugai
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance detecting circuit
- Patent number 6,278,283
- Issue date Aug 21, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Tsugai
- G01 - MEASURING TESTING
Information Patent Grant
Micro-mirror device
- Patent number 6,259,548
- Issue date Jul 10, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Tsugai
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Multi-axis acceleration sensor and manufacturing method thereof
- Patent number 6,201,284
- Issue date Mar 13, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Yoshiaki Hirata
- G01 - MEASURING TESTING
Information Patent Grant
Pressure switch
- Patent number 6,194,678
- Issue date Feb 27, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Eiji Yoshikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vibrating type angular velocity sensor
- Patent number 6,125,700
- Issue date Oct 3, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Tsugai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor accelerometer switch
- Patent number 6,078,016
- Issue date Jun 20, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Eiji Yoshikawa
- G01 - MEASURING TESTING
Information Patent Grant
Interface circuit for capacitive sensor
- Patent number 5,986,497
- Issue date Nov 16, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Tsugai
- G01 - MEASURING TESTING
Information Patent Grant
Method of micromachining a semiconductor
- Patent number 5,980,762
- Issue date Nov 9, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Hiroshi Otani
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Capacitance type sensor interface circuit
- Patent number 5,977,803
- Issue date Nov 2, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Tsugai
- G01 - MEASURING TESTING
Information Patent Grant
capacitive sensor interface circuit
- Patent number 5,751,154
- Issue date May 12, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Tsugai
- G01 - MEASURING TESTING
Information Patent Grant
Method for compensating an offset voltage temperature drift in a se...
- Patent number 5,534,773
- Issue date Jul 9, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Tsugai
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor acceleration sensor
- Patent number 4,990,986
- Issue date Feb 5, 1991
- Nissan Motor Co., Ltd.
- Koichi Murakami
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VIBRATORY GYROSCOPE
- Publication number 20060283245
- Publication date Dec 21, 2006
- Mitsubishi Denki Kabushiki Kaisha
- Nobuaki KONNO
- G01 - MEASURING TESTING
Information Patent Application
Tunable semiconductor laser apparatus with external resonator
- Publication number 20050185680
- Publication date Aug 25, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Takashi Tokunaga
- G02 - OPTICS
Information Patent Application
Capacitance-type inertial detecting device
- Publication number 20040226377
- Publication date Nov 18, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Tsugai
- G01 - MEASURING TESTING
Information Patent Application
Acceleration sensor
- Publication number 20040079154
- Publication date Apr 29, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Eiji Yoshikawa
- G01 - MEASURING TESTING
Information Patent Application
Accleration sensor
- Publication number 20040025591
- Publication date Feb 12, 2004
- Eiji Yoshikawa
- G01 - MEASURING TESTING
Information Patent Application
Angular velocity sensor
- Publication number 20020139187
- Publication date Oct 3, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Masahiro Tsugai
- G01 - MEASURING TESTING

Masahiro Tsugai

Person

Patents Grantslast 30 patents

Capacitance-type inertial detecting device

Acceleration sensor

Angular velocity sensor

Angular rate sensor

Capacitance detecting circuit

Micro-mirror device

Multi-axis acceleration sensor and manufacturing method thereof

Pressure switch

Vibrating type angular velocity sensor

Semiconductor accelerometer switch

Interface circuit for capacitive sensor

Method of micromachining a semiconductor

Capacitance type sensor interface circuit

capacitive sensor interface circuit

Method for compensating an offset voltage temperature drift in a se...

Semiconductor acceleration sensor

Patents Applicationslast 30 patents

VIBRATORY GYROSCOPE

Tunable semiconductor laser apparatus with external resonator

Capacitance-type inertial detecting device

Acceleration sensor

Accleration sensor

Angular velocity sensor