Masahiro UENO

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Kashiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Flaw detection testing device for hub unit
- Patent number 8,752,421
- Issue date Jun 17, 2014
- JTEKT Corporation
- Masashi Koumoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FLAW DETECTION TESTING DEVICE FOR HUB UNIT
- Publication number 20120180559
- Publication date Jul 19, 2012
- JTEKT Corporation
- Masashi KOUMOTO
- G01 - MEASURING TESTING