Masahiro Yamaoka

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Patents Grantslast 30 patents

Information Patent Grant
Ion beam device
- Patent number 9,508,521
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 8,779,380
- Issue date Jul 15, 2014
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Immunoassay system and immunoassay method
- Patent number 7,993,581
- Issue date Aug 9, 2011
- Hitachi, Ltd.
- Yusuke Seki
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer
- Patent number 6,989,531
- Issue date Jan 24, 2006
- Hitachi High-Technologies Corporation, Ltd.
- Atsumu Hirabayashi
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer displacement measuring system, exposure appara...
- Patent number 6,839,142
- Issue date Jan 4, 2005
- Hitachi, Ltd.
- Fumio Isshiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser interferometer displacement measuring system, exposure appara...
- Patent number 6,687,013
- Issue date Feb 3, 2004
- Hitachi, Ltd.
- Fumio Isshiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 5,065,034
- Issue date Nov 12, 1991
- Hitachi, Ltd.
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MIRROR ELECTRONIC INSPECTION DEVICE
- Publication number 20210313138
- Publication date Oct 7, 2021
- HITACHI HIGH-TECH CORPORATION
- Masahiro YAMAOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20170076902
- Publication date Mar 16, 2017
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20140319370
- Publication date Oct 30, 2014
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20110147609
- Publication date Jun 23, 2011
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Immunoassay system and immunoassay method
- Publication number 20050202572
- Publication date Sep 15, 2005
- Hitachi, Ltd.
- Yasuke Seki
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometer
- Publication number 20050092917
- Publication date May 5, 2005
- Hitachi High-Technologies Corporation
- Atsumu Hirabayashi
- G01 - MEASURING TESTING
Information Patent Application
Laser interferometer displacement measuring system, exposure appara...
- Publication number 20040057055
- Publication date Mar 25, 2004
- Fumio Isshiki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY