Masahiro Yanagida

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device including abnormality detection circuit and se...
- Patent number 11,908,534
- Issue date Feb 20, 2024
- Fujitsu Limited
- Masahiro Yanagida
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit, test circuit, and method of testing
- Patent number 8,819,509
- Issue date Aug 26, 2014
- Fujitsu Limited
- Masahiro Yanagida
- G11 - INFORMATION STORAGE
Information Patent Grant
Processor and method for controlling storage-device test unit
- Patent number 8,365,027
- Issue date Jan 29, 2013
- Fujitsu Limited
- Masahiro Yanagida
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage circuit, integrated circuit, and scanning method
- Patent number 8,356,217
- Issue date Jan 15, 2013
- Fujitsu Limited
- Hitoshi Yamanaka
- G01 - MEASURING TESTING
Information Patent Grant
Pipeline operation method and pipeline operation device to interloc...
- Patent number 6,460,129
- Issue date Oct 1, 2002
- Fujitsu Limited
- Shinichi Moriwaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of and apparatus for discriminating NaN
- Patent number 5,481,489
- Issue date Jan 2, 1996
- Fujitsu Limited
- Masahiro Yanagida
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING ABNORMALITY DETECTION CIRCUIT AND SE...
- Publication number 20220336034
- Publication date Oct 20, 2022
- Fujitsu Limited
- Masahiro Yanagida
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING METHOD AND SEMICONDUCTOR INTEGRATED CIRCUIT TO WHICH THE SA...
- Publication number 20140040686
- Publication date Feb 6, 2014
- Fujitsu Limited
- MASAHIRO YANAGIDA
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF TESTING SEMICONDUCTO...
- Publication number 20130163356
- Publication date Jun 27, 2013
- Fujitsu Limited
- Masahiro Yanagida
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT, TEST CIRCUIT, AND METHOD OF TESTING
- Publication number 20130111281
- Publication date May 2, 2013
- Fujitsu Limited
- Masahiro Yanagida
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE CIRCUIT, INTEGRATED CIRCUIT, AND SCANNING METHOD
- Publication number 20100332930
- Publication date Dec 30, 2010
- FUJITSU LIMITED
- Hitoshi YAMANAKA
- G01 - MEASURING TESTING
Information Patent Application
PROCESSOR AND METHOD FOR CONTROLLING STORAGE-DEVICE TEST UNIT
- Publication number 20100138707
- Publication date Jun 3, 2010
- Fujitsu Microelectronics Limited
- Masahiro Yanagida
- G06 - COMPUTING CALCULATING COUNTING