Masahisa Ikeya

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for preventing rapid temperature variation during wafer p...
- Patent number 6,919,541
- Issue date Jul 19, 2005
- Oki Electric Industry Co., Ltd.
- Masahisa Ikeya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a semiconductor device with a gold conductive...
- Patent number 6,867,120
- Issue date Mar 15, 2005
- Oki Electric Industry Co., Ltd.
- Takehiko Okajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming semiconductor device
- Patent number 6,440,846
- Issue date Aug 27, 2002
- Oki Electric Industry Co., Ltd.
- Masahisa Ikeya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit and fabricating method and evaluating method of...
- Patent number 6,423,559
- Issue date Jul 23, 2002
- Oki Electric Industry Co.
- Masahisa Ikeya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for preventing rapid temperature variation of...
- Patent number 6,413,888
- Issue date Jul 2, 2002
- Oki Electric Industry Co., Ltd.
- Masahisa Ikeya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming integrated circuit with evaluation contacts elect...
- Patent number 6,251,696
- Issue date Jun 26, 2001
- Oki Electric Industry, Co. Ltd.
- Masahisa Ikeya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit and fabricating method and evaluating method of...
- Patent number 5,994,716
- Issue date Nov 30, 1999
- Oki Electric Industry, Co. Ltd.
- Masahisa Ikeya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compound semiconductor device and method of making it
- Patent number 5,412,236
- Issue date May 2, 1995
- Oki Electric Industry Co., Ltd.
- Masahisa Ikeya
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for fabrication a semiconductor device having an organic ins...
- Publication number 20040018744
- Publication date Jan 29, 2004
- Takehiko Okajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for preventing rapid temperature variation dur...
- Publication number 20020119679
- Publication date Aug 29, 2002
- Masahisa Ikeya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit and fabricating method and evaluating method of...
- Publication number 20010007356
- Publication date Jul 12, 2001
- Masahisa Ikeya
- H01 - BASIC ELECTRIC ELEMENTS

Masahisa Ikeya

Person

Patents Grantslast 30 patents

Apparatus for preventing rapid temperature variation during wafer p...

Method of fabricating a semiconductor device with a gold conductive...

Method for forming semiconductor device

Integrated circuit and fabricating method and evaluating method of...

Method and apparatus for preventing rapid temperature variation of...

Method of forming integrated circuit with evaluation contacts elect...

Integrated circuit and fabricating method and evaluating method of...

Compound semiconductor device and method of making it

Patents Applicationslast 30 patents

Method for fabrication a semiconductor device having an organic ins...

Method and apparatus for preventing rapid temperature variation dur...

Integrated circuit and fabricating method and evaluating method of...