Masahisa Tazawa

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Aomori, JP

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Patents Grantslast 30 patents

Information Patent Grant
Current test probe having a solder guide portion, and related probe...
- Patent number 7,888,958
- Issue date Feb 15, 2011
- Kabushiki Kaisha Nihon Micronics
- Akira Souma
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probe
- Patent number 7,629,807
- Issue date Dec 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing magnetic head
- Patent number 5,033,184
- Issue date Jul 23, 1991
- Nakamichi Corporation
- Takahiko Tandai
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PROBE FOR CURRENT TEST, PROBE ASSEMBLY AND PRODUCTION METHOD THEREOF
- Publication number 20100213956
- Publication date Aug 26, 2010
- KABUSHIKI KAISHA NIHON MICRONICS
- Akira Souma
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TEST PROBE
- Publication number 20090058441
- Publication date Mar 5, 2009
- KABUSHIKI KAISHA NIHON MICRONICS
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY AND METHOD FOR PRODUCING IT
- Publication number 20090015276
- Publication date Jan 15, 2009
- Kabushiki Kaisha Nihon Micronics
- Masatoshi YOKOUCHI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE AND PROBE ASSEMBLY
- Publication number 20080191727
- Publication date Aug 14, 2008
- Kabushiki Kaisha Nihon Micronics
- Yuko YAMADA
- G01 - MEASURING TESTING