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Masahito Kobayashi
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Yamanashi-Ken, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Lifetime estimating system and method for heating source, and inspe...
Patent number
11,796,400
Issue date
Oct 24, 2023
Tokyo Electron Limited
Masahito Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Test device control method and test device
Patent number
11,768,236
Issue date
Sep 26, 2023
Tokyo Electron Limited
Hiroaki Agawa
G01 - MEASURING TESTING
Information
Patent Grant
Temperature control device and method, and inspection apparatus
Patent number
11,740,643
Issue date
Aug 29, 2023
Tokyo Electron Limited
Masahito Kobayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,662,367
Issue date
May 30, 2023
Tokyo Electron Limited
Masahito Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Substrate support and inspection apparatus
Patent number
11,557,494
Issue date
Jan 17, 2023
Tokyo Electron Limited
Masahito Kobayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Testing device
Patent number
11,340,283
Issue date
May 24, 2022
Tokyo Electron Limited
Shigeru Kasai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Temperature control device, temperature control method, and inspect...
Patent number
11,169,204
Issue date
Nov 9, 2021
Tokyo Electron Limited
Masahito Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Probe polishing method and probe polishing member
Patent number
7,465,218
Issue date
Dec 16, 2008
Tokyo Electron Limited
Masahito Kobayashi
B24 - GRINDING POLISHING
Information
Patent Grant
Detection method/device of probe's tip location using a transparent...
Patent number
7,397,257
Issue date
Jul 8, 2008
Tokyo Electron Limited
Masahito Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Probing method and probing apparatus
Patent number
7,009,415
Issue date
Mar 7, 2006
Tokyo Electron Limited
Masahito Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Prober
Patent number
6,933,736
Issue date
Aug 23, 2005
Tokyo Electron Limited
Masahito Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Probing method and probing apparatus in which steady load is applie...
Patent number
6,777,968
Issue date
Aug 17, 2004
Tokyo Electron Limted
Masahito Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Probe-test method and prober
Patent number
6,297,656
Issue date
Oct 2, 2001
Tokyo Electron Limited
Masahito Kobayashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
STAGE, TESTING APPARATUS, AND STAGE OPERATING METHOD
Publication number
20230110797
Publication date
Apr 13, 2023
TOKYO ELECTRON LIMITED
Masahito KOBAYASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEMPERATURE CONTROL DEVICE, TEMPERATURE CONTROL METHOD, AND INSPECT...
Publication number
20220262661
Publication date
Aug 18, 2022
TOKYO ELECTRON LIMITED
Shigeru KASAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST DEVICE CONTROL METHOD AND TEST DEVICE
Publication number
20220178994
Publication date
Jun 9, 2022
TOKYO ELECTRON LIMITED
Hiroaki AGAWA
G01 - MEASURING TESTING
Information
Patent Application
TEST DEVICE AND PROBE POLISHING METHOD
Publication number
20220128603
Publication date
Apr 28, 2022
TOKYO ELECTRON LIMITED
Masahito KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE SUPPORT AND INSPECTION APPARATUS
Publication number
20210407829
Publication date
Dec 30, 2021
TOKYO ELECTRON LIMITED
Masahito KOBAYASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20210405089
Publication date
Dec 30, 2021
TOKYO ELECTRON LIMITED
Masahito KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
LIFETIME ESTIMATING SYSTEM AND METHOD FOR HEATING SOURCE, AND INSPE...
Publication number
20210247248
Publication date
Aug 12, 2021
TOKYO ELECTRON LIMITED
Masahito KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE CONTROL DEVICE AND METHOD, AND INSPECTION APPARATUS
Publication number
20210247786
Publication date
Aug 12, 2021
TOKYO ELECTRON LIMITED
Masahito KOBAYASHI
G05 - CONTROLLING REGULATING
Information
Patent Application
TESTING DEVICE
Publication number
20200408828
Publication date
Dec 31, 2020
TOKYO ELECTRON LIMITED
Shigeru KASAI
G01 - MEASURING TESTING
Information
Patent Application
Temperature Control Device, Temperature Control Method, and Inspect...
Publication number
20200174066
Publication date
Jun 4, 2020
TOKYO ELECTRON LIMITED
Masahito KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
PROBE POLISHING METHOD AND PROBE POLISHING MEMBER
Publication number
20080182483
Publication date
Jul 31, 2008
TOKYO ELECTRON LIMITED
Masahito KOBAYASHI
B24 - GRINDING POLISHING
Information
Patent Application
DETECTION METHOD OF PROBE'S TIP LOCATION, STORAGE MEDIUM STORING TH...
Publication number
20070229098
Publication date
Oct 4, 2007
TOKYO ELECTRON LIMITED
Masahito KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
PROBE POLISHING METHOD AND PROBE POLISHING MEMBER
Publication number
20070141956
Publication date
Jun 21, 2007
TOKYO ELECTON LIMITED
Masahito Kobayashi
B24 - GRINDING POLISHING
Information
Patent Application
Probing method and probing apparatus
Publication number
20040227535
Publication date
Nov 18, 2004
TOKYO ELECTRON LIMITED
Masahito Kobayashi
G01 - MEASURING TESTING
Information
Patent Application
Prober
Publication number
20040164759
Publication date
Aug 26, 2004
Masahito Kobayashi
G01 - MEASURING TESTING