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Masakatsu Hasuda
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Chiba, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Mask defect repair apparatus and mask defect repair method
Patent number
11,906,899
Issue date
Feb 20, 2024
Hitachi High-Tech Science Corporation
Yoshitomo Nakagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus
Patent number
10,468,228
Issue date
Nov 5, 2019
Hitachi High-Tech Science Corporation
Masakatsu Hasuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample carrying device and vacuum apparatus
Patent number
9,885,639
Issue date
Feb 6, 2018
Hitachi High-Tech Science Corporation
Masakatsu Hasuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus and sample transporting apparatus
Patent number
8,674,324
Issue date
Mar 18, 2014
Hitachi High-Tech Science Corporation
Masakatsu Hasuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope and specimen analyzing method
Patent number
8,664,598
Issue date
Mar 4, 2014
SII NanoTechnology Inc.
Masakatsu Hasuda
G01 - MEASURING TESTING
Information
Patent Grant
Composite charged particle beam apparatus and sample processing and...
Patent number
8,642,958
Issue date
Feb 4, 2014
SII NanoTechnology Inc.
Haruo Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample holding mechanism and sample working/observing apparatus
Patent number
7,574,932
Issue date
Aug 18, 2009
Sii Nano Technology Inc.
Masakatsu Hasuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thermal analysis apparatus
Patent number
7,500,779
Issue date
Mar 10, 2009
SII NanoTechnology Inc.
Toshitada Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Ion beam device and ion beam processing method, and holder member
Patent number
7,297,944
Issue date
Nov 20, 2007
SII NanoTechnology Inc.
Toshio Kodama
G01 - MEASURING TESTING
Information
Patent Grant
Ion beam device and ion beam processing method
Patent number
7,276,691
Issue date
Oct 2, 2007
SII NanoTechnology Inc.
Toshio Kodama
G01 - MEASURING TESTING
Information
Patent Grant
Ion beam apparatus, ion beam processing method and sample holder me...
Patent number
6,838,685
Issue date
Jan 4, 2005
SII NanoTechnology Inc.
Toshio Kodama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MASK DEFECT REPAIR APPARATUS AND MASK DEFECT REPAIR METHOD
Publication number
20200310246
Publication date
Oct 1, 2020
HITACHI HIGH-TECH SCIENCE CORPORATION
Yoshitomo NAKAGAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS
Publication number
20180286628
Publication date
Oct 4, 2018
HITACHI HIGH-TECH SCIENCE CORPORATION
Masakatsu HASUDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
Publication number
20170271119
Publication date
Sep 21, 2017
HITACHI HIGH-TECH SCIENCE CORPORATION
Tsuyoshi OONISHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRANSPORT DEVICE, TREATMENT DEVICE, VACUUM DEVICE, AND CHARGED PART...
Publication number
20170062174
Publication date
Mar 2, 2017
HITACHI HIGH-TECH SCIENCE CORPORATION
Toshiyuki Iwahori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE CARRYING DEVICE AND VACUUM APPARATUS
Publication number
20160223434
Publication date
Aug 4, 2016
HITACHI HIGH-TECH SCIENCE CORPORATION
Masakatsu HASUDA
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS AND SAMPLE TRANSPORTING APPARATUS
Publication number
20130240730
Publication date
Sep 19, 2013
HITACHI HIGH-TECH SCIENCE CORPORATION
Masakatsu HASUDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Composite charged particle beam apparatus and sample processing and...
Publication number
20110226947
Publication date
Sep 22, 2011
Haruo Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron microscope and specimen analyzing method
Publication number
20110186734
Publication date
Aug 4, 2011
Masakatsu Hasuda
G01 - MEASURING TESTING
Information
Patent Application
Sample holding mechanism and sample working/observing apparatus
Publication number
20080224374
Publication date
Sep 18, 2008
Masakatsu Hasuda
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Thermal analysis apparatus
Publication number
20070201533
Publication date
Aug 30, 2007
Toshitada Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
Ion beam device and ion beam processing method
Publication number
20060163497
Publication date
Jul 27, 2006
Toshio Kodama
G01 - MEASURING TESTING
Information
Patent Application
Ion beam device and ion beam processing method, and holder member
Publication number
20050236587
Publication date
Oct 27, 2005
Toshio Kodama
G01 - MEASURING TESTING