Masakatsu Suda

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Authentication system, authentication method and service providing...
- Patent number 9,871,789
- Issue date Jan 16, 2018
- Advantest Corporation
- Katsuhiko Degawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Authentication terminal
- Patent number 9,871,788
- Issue date Jan 16, 2018
- Advantest Corporation
- Katsuhiko Degawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor circuit with load balance circuit
- Patent number 8,555,098
- Issue date Oct 8, 2013
- Advantest Corporation
- Tasuku Fujibe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Clock hand-off circuit
- Patent number 8,451,034
- Issue date May 28, 2013
- Advantest Corporation
- Tasuku Fujibe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Timing generator and test apparatus
- Patent number 8,441,296
- Issue date May 14, 2013
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for manufacturing substrate for testing, method for manuf...
- Patent number 8,375,340
- Issue date Feb 12, 2013
- Advantest Corporation
- Daisuke Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Signal generation and detection apparatus and tester
- Patent number 8,330,471
- Issue date Dec 11, 2012
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Loop type clock adjustment circuit and test device
- Patent number 8,198,926
- Issue date Jun 12, 2012
- Advantest Corporation
- Kazuhiro Fujita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Delay lock loop circuit, timing generator, semiconductor test devic...
- Patent number 8,058,891
- Issue date Nov 15, 2011
- Advantest Corp.
- Takuya Hasumi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Delay circuit, test apparatus, storage medium semiconductor chip, i...
- Patent number 7,987,062
- Issue date Jul 26, 2011
- Advantest Corporation
- Kazuhiro Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, test method and computer readable medium
- Patent number 7,979,218
- Issue date Jul 12, 2011
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Variable delay circuit, timing generator and semiconductor testing...
- Patent number 7,960,996
- Issue date Jun 14, 2011
- Advantest Corp.
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Timing generator and semiconductor test apparatus
- Patent number 7,944,263
- Issue date May 17, 2011
- Advantest Corp.
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Timing generator and semiconductor test apparatus
- Patent number 7,940,072
- Issue date May 10, 2011
- Advantest Corp.
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Test device, test method and computer readable media
- Patent number 7,908,110
- Issue date Mar 15, 2011
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Oscillation circuit, test apparatus and electronic device
- Patent number 7,863,990
- Issue date Jan 4, 2011
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Vernier delay circuit
- Patent number 7,830,191
- Issue date Nov 9, 2010
- Advantest Corporation
- Shoji Kojima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Load fluctuation correction circuit, electronic device, testing dev...
- Patent number 7,800,390
- Issue date Sep 21, 2010
- Advantest Corporation
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronic device, load fluctuation compensation circuit, power sup...
- Patent number 7,782,075
- Issue date Aug 24, 2010
- Advantest Corporation
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Variable delay circuit, testing apparatus, and electronic device
- Patent number 7,755,407
- Issue date Jul 13, 2010
- Advantest Corporation
- Takuya Hasumi
- G01 - MEASURING TESTING
Information Patent Grant
Load fluctuation correction circuit, electronic device, testing dev...
- Patent number 7,714,600
- Issue date May 11, 2010
- Advantest Corporation
- Takuya Hasumi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test apparatus and test method
- Patent number 7,696,771
- Issue date Apr 13, 2010
- Advantest Corporation
- Koichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Timing generator and semiconductor testing apparatus
- Patent number 7,665,004
- Issue date Feb 16, 2010
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Pulse width adjustment circuit, pulse width adjustment method, and...
- Patent number 7,574,316
- Issue date Aug 11, 2009
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Consumption current balance circuit, compensation current amount ad...
- Patent number 7,558,692
- Issue date Jul 7, 2009
- Advantest Corp.
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Phase-locked loop circuit, delay locked loop circuit, timing genera...
- Patent number 7,535,273
- Issue date May 19, 2009
- Advantest Corp.
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Delay circuit, and testing apparatus
- Patent number 7,511,547
- Issue date Mar 31, 2009
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Phase-locked loop circuit, delay locked loop circuit, timing genera...
- Patent number 7,492,198
- Issue date Feb 17, 2009
- Advantest Corp.
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Pulse width adjustment circuit, pulse width adjustment method, and...
- Patent number 7,460,969
- Issue date Dec 2, 2008
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, measuring method, testing apparatus, testing m...
- Patent number 7,398,169
- Issue date Jul 8, 2008
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTHENTICATION SYSTEM, AUTHENTICATION METHOD AND SERVICE PROVIDING...
- Publication number 20160127362
- Publication date May 5, 2016
- Advantest Corporation
- Katsuhiko DEGAWA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
AUTHENTICATION TERMINAL
- Publication number 20160127361
- Publication date May 5, 2016
- Advantest Corporation
- Katsuhiko DEGAWA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TIMING GENERATOR AND TEST APPARATUS
- Publication number 20120262215
- Publication date Oct 18, 2012
- Advantest Corporation
- Masakatsu Suda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS, MEASUREMENT APPARATUS, AND ELECTRONIC DEVICE
- Publication number 20110231128
- Publication date Sep 22, 2011
- Advantest Corporation
- Masakatsu SUDA
- G01 - MEASURING TESTING
Information Patent Application
CLOCK HAND-OFF CIRCUIT
- Publication number 20110128052
- Publication date Jun 2, 2011
- Advantest Corporation
- Tasuku Fujibe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
APPARATUS FOR MANUFACTURING SUBSTRATE FOR TESTING, METHOD FOR MANUF...
- Publication number 20110125308
- Publication date May 26, 2011
- Advantest Corporation
- Daisuke WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20110109377
- Publication date May 12, 2011
- Advantest Corporation
- Tasuku Fujibe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOOP TYPE CLOCK ADJUSTMENT CIRCUIT AND TEST DEVICE
- Publication number 20110089983
- Publication date Apr 21, 2011
- Advantest Corporation
- Kazuhiro Fujita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Timing generator and semiconductor test apparatus
- Publication number 20100060294
- Publication date Mar 11, 2010
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LOAD FLUCTUATION CORRECTION CIRCUIT, ELECTRONIC DEVICE, TESTING DEV...
- Publication number 20100039078
- Publication date Feb 18, 2010
- Advantest Corporation
- Masakatsu SUDA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
VARIABLE DELAY CIRCUIT, TIMING GENERATOR AND SEMICONDUCTOR TESTING...
- Publication number 20100019795
- Publication date Jan 28, 2010
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST APPARATUS, TEST METHOD AND COMPUTER READABLE MEDIUM
- Publication number 20090287431
- Publication date Nov 19, 2009
- Advantest Corporation
- MASAKATSU SUDA
- G01 - MEASURING TESTING
Information Patent Application
VERNIER DELAY CIRCUIT
- Publication number 20090273384
- Publication date Nov 5, 2009
- Advantest Corporation
- Shoji Kojima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIGNAL OUTPUT DEVICE, SIGNAL DETECTION DEVICE, TESTER, ELECTRON DEV...
- Publication number 20090265597
- Publication date Oct 22, 2009
- Advantest Corporation
- MASAKATSU SUDA
- G01 - MEASURING TESTING
Information Patent Application
Delay Lock Loop Circuit, Timing Generator, Semiconductor Test Devic...
- Publication number 20090256577
- Publication date Oct 15, 2009
- Takuya Hasumi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Timing generator and semiconductor test apparatus
- Publication number 20090230946
- Publication date Sep 17, 2009
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST DEVICE, TEST METHOD AND COMPUTER READABLE MEDIA
- Publication number 20090228227
- Publication date Sep 10, 2009
- Advantest Corporation
- MASAKATSU SUDA
- G01 - MEASURING TESTING
Information Patent Application
Delay lock loop circuit, phase lock loop circuit, timing generator,...
- Publication number 20090184741
- Publication date Jul 23, 2009
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ELECTRONIC DEVICE, LOAD FLUCTUATION COMPENSATION CIRCUIT, POWER SUP...
- Publication number 20090160536
- Publication date Jun 25, 2009
- Advantest Corporation
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
OSCILLATION CIRCUIT, TEST APPARATUS AND ELECTRONIC DEVICE
- Publication number 20090146703
- Publication date Jun 11, 2009
- Advantest Corporation
- MASAKATSU SUDA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TIMING GENERATOR AND SEMICONDUCTOR TESTING APPARATUS
- Publication number 20090132884
- Publication date May 21, 2009
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20090058452
- Publication date Mar 5, 2009
- Advantest Corporation
- KOICHI TANAKA
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE DELAY CIRCUIT, TESTING APPARATUS, AND ELECTRONIC DEVICE
- Publication number 20090039939
- Publication date Feb 12, 2009
- Advantest Corporation
- TAKUYA HASUMI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Delay circuit and test apparatus
- Publication number 20080258714
- Publication date Oct 23, 2008
- Advantest Corporation
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PULSE WIDTH ADJUSTMENT CIRCUIT, PULSE WIDTH ADJUSTMENT METHOD, AND...
- Publication number 20080201099
- Publication date Aug 21, 2008
- Advantest Corporation
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Phase-locked loop circuit, delay locked loop circuit, timing genera...
- Publication number 20080143399
- Publication date Jun 19, 2008
- Advantest Corporation
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Consumption Current Balance Circuit, Compensation Current Amount Ad...
- Publication number 20080116901
- Publication date May 22, 2008
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Application
DELAY CIRCUIT, TEST APPARATUS, STORAGE MEDIUM SEMICONDUCTOR CHIP, I...
- Publication number 20080048750
- Publication date Feb 28, 2008
- Advantest Corporation
- Kazuhiro Fujita
- G01 - MEASURING TESTING
Information Patent Application
Pulse width adjustment circuit, pulse width adjustment method, and...
- Publication number 20080018371
- Publication date Jan 24, 2008
- Advantest Corporation
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Measuring apparatus, measuring method, testing apparatus, testing m...
- Publication number 20070203659
- Publication date Aug 30, 2007
- Takahiro Yamaguchi
- G01 - MEASURING TESTING

Masakatsu Suda

Person

Patents Grantslast 30 patents

Authentication system, authentication method and service providing...

Authentication terminal

Semiconductor circuit with load balance circuit

Clock hand-off circuit

Timing generator and test apparatus

Apparatus for manufacturing substrate for testing, method for manuf...

Signal generation and detection apparatus and tester

Loop type clock adjustment circuit and test device

Delay lock loop circuit, timing generator, semiconductor test devic...

Delay circuit, test apparatus, storage medium semiconductor chip, i...

Test apparatus, test method and computer readable medium

Variable delay circuit, timing generator and semiconductor testing...

Timing generator and semiconductor test apparatus

Timing generator and semiconductor test apparatus

Test device, test method and computer readable media

Oscillation circuit, test apparatus and electronic device

Vernier delay circuit

Load fluctuation correction circuit, electronic device, testing dev...

Electronic device, load fluctuation compensation circuit, power sup...

Variable delay circuit, testing apparatus, and electronic device

Load fluctuation correction circuit, electronic device, testing dev...

Test apparatus and test method

Timing generator and semiconductor testing apparatus

Pulse width adjustment circuit, pulse width adjustment method, and...

Consumption current balance circuit, compensation current amount ad...

Phase-locked loop circuit, delay locked loop circuit, timing genera...

Delay circuit, and testing apparatus

Phase-locked loop circuit, delay locked loop circuit, timing genera...

Pulse width adjustment circuit, pulse width adjustment method, and...

Measuring apparatus, measuring method, testing apparatus, testing m...

Patents Applicationslast 30 patents

AUTHENTICATION SYSTEM, AUTHENTICATION METHOD AND SERVICE PROVIDING...

AUTHENTICATION TERMINAL

TIMING GENERATOR AND TEST APPARATUS

TEST APPARATUS, MEASUREMENT APPARATUS, AND ELECTRONIC DEVICE

CLOCK HAND-OFF CIRCUIT

APPARATUS FOR MANUFACTURING SUBSTRATE FOR TESTING, METHOD FOR MANUF...

SEMICONDUCTOR INTEGRATED CIRCUIT

LOOP TYPE CLOCK ADJUSTMENT CIRCUIT AND TEST DEVICE

Timing generator and semiconductor test apparatus

LOAD FLUCTUATION CORRECTION CIRCUIT, ELECTRONIC DEVICE, TESTING DEV...

VARIABLE DELAY CIRCUIT, TIMING GENERATOR AND SEMICONDUCTOR TESTING...

TEST APPARATUS, TEST METHOD AND COMPUTER READABLE MEDIUM

VERNIER DELAY CIRCUIT

SIGNAL OUTPUT DEVICE, SIGNAL DETECTION DEVICE, TESTER, ELECTRON DEV...

Delay Lock Loop Circuit, Timing Generator, Semiconductor Test Devic...

Timing generator and semiconductor test apparatus

TEST DEVICE, TEST METHOD AND COMPUTER READABLE MEDIA

Delay lock loop circuit, phase lock loop circuit, timing generator,...

ELECTRONIC DEVICE, LOAD FLUCTUATION COMPENSATION CIRCUIT, POWER SUP...

OSCILLATION CIRCUIT, TEST APPARATUS AND ELECTRONIC DEVICE

TIMING GENERATOR AND SEMICONDUCTOR TESTING APPARATUS

TEST APPARATUS AND TEST METHOD

VARIABLE DELAY CIRCUIT, TESTING APPARATUS, AND ELECTRONIC DEVICE

Delay circuit and test apparatus

PULSE WIDTH ADJUSTMENT CIRCUIT, PULSE WIDTH ADJUSTMENT METHOD, AND...

Phase-locked loop circuit, delay locked loop circuit, timing genera...

Consumption Current Balance Circuit, Compensation Current Amount Ad...

DELAY CIRCUIT, TEST APPARATUS, STORAGE MEDIUM SEMICONDUCTOR CHIP, I...

Pulse width adjustment circuit, pulse width adjustment method, and...

Measuring apparatus, measuring method, testing apparatus, testing m...