Masakazu Aono

Person

Tsukuba, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electrical conduction element, electronic device, and method for op...
- Patent number 9,627,499
- Issue date Apr 18, 2017
- National Institute for Materials Science
- Kazuya Terabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double-side-coated surface stress sensor
- Patent number 9,506,822
- Issue date Nov 29, 2016
- National Institute for Materials Science
- Genki Yoshikawa
- G01 - MEASURING TESTING
Information Patent Grant
Electrochemical transistor
- Patent number 8,896,033
- Issue date Nov 25, 2014
- National Institute for Materials Science
- Tsuyoshi Hasegawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical electric field enhancement element and probe using the same
- Patent number 8,601,610
- Issue date Dec 3, 2013
- Japan Science and Technology Agency
- Yoshitaka Shingaya
- G01 - MEASURING TESTING
Information Patent Grant
Switching element and application of the same
- Patent number 8,320,154
- Issue date Nov 27, 2012
- National Institute for Materials Science
- Tsuyoshi Hasegawa
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Surface enhanced infrared absorption sensor and method for producin...
- Patent number 8,193,499
- Issue date Jun 5, 2012
- National Institute for Materials Science
- Tadaaki Nagao
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electric device using solid electrolyte
- Patent number 7,875,883
- Issue date Jan 25, 2011
- Japan Science and Technology Agency
- Toshitsugu Sakamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe microscope system
- Patent number 7,770,232
- Issue date Aug 3, 2010
- Riken
- Akira Saito
- G01 - MEASURING TESTING
Information Patent Grant
Solid electrolyte switching device, FPGA using same, memory device,...
- Patent number 7,750,332
- Issue date Jul 6, 2010
- Japan Science and Technology Agency
- Toshitsugu Sakamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Point contact array, not circuit, and electronic circuit using the...
- Patent number 7,525,410
- Issue date Apr 28, 2009
- Japan Science and Technology Agency
- Masakazu Aono
- G11 - INFORMATION STORAGE
Information Patent Grant
Point contact array, not circuit, and electronic circuit comprising...
- Patent number 7,473,982
- Issue date Jan 6, 2009
- Japan Science and Technology Agency
- Masakazu Aono
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe microscope and specimen surface structure measuring...
- Patent number 7,241,994
- Issue date Jul 10, 2007
- Riken
- Tsuyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Point contact array, not circuit, and electronic circuit comprising...
- Patent number 7,026,911
- Issue date Apr 11, 2006
- Japan Science and Technology Corporation
- Masakazu Aono
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic device having controllable conductance
- Patent number 6,891,186
- Issue date May 10, 2005
- Japan Science and Technology Corporation
- Masakazu Aono
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for evaluating electrical characteristics
- Patent number 6,833,719
- Issue date Dec 21, 2004
- Japan Science and Technology Corporation
- Tsuyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength-tunable light emitting device
- Patent number 6,707,070
- Issue date Mar 16, 2004
- Riken
- Makoto Sakurai
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming a polymer molecule chain
- Patent number 6,656,662
- Issue date Dec 2, 2003
- Japan Science and Technology Corporation
- Yuji Okawa
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Scanning tunneling microscope, its probe, processing method for the...
- Patent number 6,608,306
- Issue date Aug 19, 2003
- Japan Science and Technology Corporation
- Masakazu Aono
- G01 - MEASURING TESTING
Information Patent Grant
Ion scattering spectrometer
- Patent number 6,448,554
- Issue date Sep 10, 2002
- The Institute of Physical and Chemical Research (Riken)
- Masakazu Aono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Superconducting magnetic shield
- Patent number 5,418,512
- Issue date May 23, 1995
- Mitsui Kinzoku Kogyo Kabushiki Shisha
- Hiroshi Ohta
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Superconducting magnetic shield
- Patent number 5,187,327
- Issue date Feb 16, 1993
- Mitsui Kinzoku Kogyo Kabushiki Kaisha
- Hiroshi Ohta
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ion-scattering spectrometer
- Patent number 5,166,521
- Issue date Nov 24, 1992
- Shimadzu Corporation
- Shigeki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL CONDUCTION ELEMENT, ELECTRONIC DEVICE, AND METHOD FOR OP...
- Publication number 20160276453
- Publication date Sep 22, 2016
- Kazuya TERABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DOUBLE-SIDE-COATED SURFACE STRESS SENSOR
- Publication number 20140352447
- Publication date Dec 4, 2014
- NATIONAL INSTITUTE FOR MATERIALS SCIENCE
- Genki Yoshikawa
- G01 - MEASURING TESTING
Information Patent Application
ELECTROCHEMICAL TRANSISTOR
- Publication number 20130140648
- Publication date Jun 6, 2013
- Tsuyoshi Hasegawa
- G11 - INFORMATION STORAGE
Information Patent Application
SWITCHING ELEMENT AND APPLICATION OF THE SAME
- Publication number 20110273920
- Publication date Nov 10, 2011
- Tsuyoshi Hasegawa
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
OPTICAL ELECTRIC FIELD ENHANCEMENT ELEMENT AND PROBE USING THE SAME
- Publication number 20100281587
- Publication date Nov 4, 2010
- Yoshitaka Shingaya
- G01 - MEASURING TESTING
Information Patent Application
SURFACE ENHANCED INFRARED ABSORPTION SENSOR AND METHOD FOR PRODUCIN...
- Publication number 20100239821
- Publication date Sep 23, 2010
- Tadaaki Nagao
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope System
- Publication number 20080258059
- Publication date Oct 23, 2008
- Riken
- Akira Saito
- G01 - MEASURING TESTING
Information Patent Application
Electric device using sold electrolyte
- Publication number 20060157802
- Publication date Jul 20, 2006
- Toshitsugu Sakamoto
- G11 - INFORMATION STORAGE
Information Patent Application
Scanning probe microscope and specimen surface structure measuring...
- Publication number 20050242283
- Publication date Nov 3, 2005
- Tsuyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Point contact array, not circuit, and electronic circuit using the...
- Publication number 20050243844
- Publication date Nov 3, 2005
- Japan Science and Technology Corporation
- Masakazu Aono
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Solid electrolyte switching device, fpga using same, memory device,...
- Publication number 20050127524
- Publication date Jun 16, 2005
- Toshitsugu Sakamoto
- G11 - INFORMATION STORAGE
Information Patent Application
Point contact array, not circuit, and electronic circuit comprising...
- Publication number 20050014325
- Publication date Jan 20, 2005
- Japan Science and Technology Corporation
- Masakazu Aono
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Electronic device having controllable conductance
- Publication number 20040089882
- Publication date May 13, 2004
- Masakazu Aono
- G11 - INFORMATION STORAGE
Information Patent Application
Point contact array, not circuit, and electronic circuit comprising...
- Publication number 20030174042
- Publication date Sep 18, 2003
- Masakazu Aono
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Wavelength-tunable light emitting device
- Publication number 20020179915
- Publication date Dec 5, 2002
- Makoto Sakurai
- B82 - NANO-TECHNOLOGY
Information Patent Application
Apparatus for evaluating electrical characteristics
- Publication number 20020178800
- Publication date Dec 5, 2002
- Tsuyoshi Hasegawa
- B82 - NANO-TECHNOLOGY

Masakazu Aono

Person

Patents Grantslast 30 patents

Electrical conduction element, electronic device, and method for op...

Double-side-coated surface stress sensor

Electrochemical transistor

Optical electric field enhancement element and probe using the same

Switching element and application of the same

Surface enhanced infrared absorption sensor and method for producin...

Electric device using solid electrolyte

Scanning probe microscope system

Solid electrolyte switching device, FPGA using same, memory device,...

Point contact array, not circuit, and electronic circuit using the...

Point contact array, not circuit, and electronic circuit comprising...

Scanning probe microscope and specimen surface structure measuring...

Point contact array, not circuit, and electronic circuit comprising...

Electronic device having controllable conductance

Apparatus for evaluating electrical characteristics

Wavelength-tunable light emitting device

Method of forming a polymer molecule chain

Scanning tunneling microscope, its probe, processing method for the...

Ion scattering spectrometer

Superconducting magnetic shield

Superconducting magnetic shield

Ion-scattering spectrometer

Patents Applicationslast 30 patents

ELECTRICAL CONDUCTION ELEMENT, ELECTRONIC DEVICE, AND METHOD FOR OP...

DOUBLE-SIDE-COATED SURFACE STRESS SENSOR

ELECTROCHEMICAL TRANSISTOR

SWITCHING ELEMENT AND APPLICATION OF THE SAME

OPTICAL ELECTRIC FIELD ENHANCEMENT ELEMENT AND PROBE USING THE SAME

SURFACE ENHANCED INFRARED ABSORPTION SENSOR AND METHOD FOR PRODUCIN...

Scanning Probe Microscope System

Electric device using sold electrolyte

Scanning probe microscope and specimen surface structure measuring...

Point contact array, not circuit, and electronic circuit using the...

Solid electrolyte switching device, fpga using same, memory device,...

Point contact array, not circuit, and electronic circuit comprising...

Electronic device having controllable conductance

Point contact array, not circuit, and electronic circuit comprising...

Wavelength-tunable light emitting device

Apparatus for evaluating electrical characteristics