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Masakazu Baba
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Particle manipulation unit, chip and detection device having the sa...
Patent number
7,842,514
Issue date
Nov 30, 2010
NEC Corporation
Wataru Hattori
G01 - MEASURING TESTING
Information
Patent Grant
Chip, device using the chip, and method of using the same
Patent number
7,785,533
Issue date
Aug 31, 2010
NEC Corporation
Machiko Fujita
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometric system and mass spectrometry
Patent number
7,586,091
Issue date
Sep 8, 2009
NEC Corporation
Katsutoshi Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Liquid switch, and microchip and mass-analyzing system using the same
Patent number
7,274,016
Issue date
Sep 25, 2007
NEC Corporation
Kazuhiro Iida
G01 - MEASURING TESTING
Information
Patent Grant
Fractionating apparatus having colonies of pillars arranged in migr...
Patent number
6,881,315
Issue date
Apr 19, 2005
NEC Corporation
Kazuhiro Iida
G01 - MEASURING TESTING
Information
Patent Grant
Method for forming ordered structure of fine metal particles
Patent number
6,755,953
Issue date
Jun 29, 2004
NEC Corporation
Masakazu Baba
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of patterning a substrate with an atomic mask
Patent number
6,331,238
Issue date
Dec 18, 2001
NEC Corporation
Takashi Yokoyama
B32 - LAYERED PRODUCTS
Information
Patent Grant
Atomic mask and method of patterning a substrate with the atomic mask
Patent number
6,099,945
Issue date
Aug 8, 2000
NEC Corporation
Takashi Yokoyama
B32 - LAYERED PRODUCTS
Patents Applications
last 30 patents
Information
Patent Application
DIAGNOSIS SUPPORTING SYSTEM
Publication number
20090070045
Publication date
Mar 12, 2009
NEC Corporation
Wataru Hattori
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DNA FRAGMENT AMPLIFICATION METHOD, REACTION APPARATUS FOR AMPLIFYIN...
Publication number
20080070283
Publication date
Mar 20, 2008
NEC Corporation
Toru Sano
G01 - MEASURING TESTING
Information
Patent Application
Chip, device using the chip, and method of using the same
Publication number
20070048179
Publication date
Mar 1, 2007
Machiko Fujita
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Mass spectrometric system and mass spectrometry
Publication number
20060214101
Publication date
Sep 28, 2006
Katsutoshi Takahashi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Dna fragment amplification method, reaction apparatus for amplifyin...
Publication number
20060210985
Publication date
Sep 21, 2006
Toru Sano
G01 - MEASURING TESTING
Information
Patent Application
Microchip, sampling method, sample separating method, sample analyz...
Publication number
20060177350
Publication date
Aug 10, 2006
NEC Corporation
Toru Sano
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Diagnosis supporting system
Publication number
20060172436
Publication date
Aug 3, 2006
NEC Corporation
Wataru Hattori
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Liquid switch, and microchip and mass-analyzing system using the same
Publication number
20060102836
Publication date
May 18, 2006
NEC Corporation
Kazuhiro Iida
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Microchip, solvent displacement method using the microchip, concent...
Publication number
20060070951
Publication date
Apr 6, 2006
Masakazu Baba
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Separating apparatus, separating method, and mass analyzing system
Publication number
20060063273
Publication date
Mar 23, 2006
NEC Corporation
Minoru Asogawa
G01 - MEASURING TESTING
Information
Patent Application
Micro chip, liquid feeding method using the micro chip, and mass an...
Publication number
20060043284
Publication date
Mar 2, 2006
NEC Corporation
Masakazu Baba
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Sample drying device as well as mass spectrometer and mass spectrom...
Publication number
20060032071
Publication date
Feb 16, 2006
Masakazu Baba
G01 - MEASURING TESTING
Information
Patent Application
Fine particle handling unit, chip and sensor mounted with same, and...
Publication number
20060035386
Publication date
Feb 16, 2006
NEC Corporation
Wataru Hattori
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Separation apparatus, method of fabricating the same, and analytica...
Publication number
20060011480
Publication date
Jan 19, 2006
Toru Sano
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Separation apparatus and separation method
Publication number
20060000772
Publication date
Jan 5, 2006
Toru Sano
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Separating device, analysis system separation method and method of...
Publication number
20040256318
Publication date
Dec 23, 2004
Kazuhiro Iida
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Separation apparatus, method of separation, and process for produci...
Publication number
20040251171
Publication date
Dec 16, 2004
Kazuhiro Iida
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Separation apparatus and process for fabricating separation apparatus
Publication number
20040108208
Publication date
Jun 10, 2004
Kazuhiro Iida
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Fractionating apparatus having colonies of pillars arranged in migr...
Publication number
20030049563
Publication date
Mar 13, 2003
NEC Corporation
Kazuhiro Iida
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Method for forming ordered structure of fine metal particles
Publication number
20020189952
Publication date
Dec 19, 2002
Masakazu Baba
B82 - NANO-TECHNOLOGY