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Masakazu Hayashi
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Yokohama, JP
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Patents Grants
last 30 patents
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Patent Grant
Brittle workpiece splitting system and brittle workpiece splitting...
Patent number
8,104,385
Issue date
Jan 31, 2012
Shibaura Mechatronics Corporation
Masakazu Hayashi
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Grant
Charge amount measurement method, shift value measurement method of...
Patent number
7,321,232
Issue date
Jan 22, 2008
Kabushiki Kaisha Toshiba
Masakazu Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Charge amount measurement method, shift value measurement method of...
Patent number
7,009,411
Issue date
Mar 7, 2006
Kabushiki Kaisha Toshiba
Masakazu Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Microscope apparatus
Patent number
4,914,293
Issue date
Apr 3, 1990
Kabushiki Kaisha Toshiba
Masakazu Hayashi
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Image information output apparatus
Patent number
4,554,580
Issue date
Nov 19, 1985
Tokyo Shibaura Denki Kabushiki Kaisha
Masakazu Hayashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD
Publication number
20070169849
Publication date
Jul 26, 2007
Susumu Yahagi
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Application
Brittle workpiece splitting system and brittle workpiece splitting...
Publication number
20060081101
Publication date
Apr 20, 2006
SHIBAURA MECHATRONICS CORPORATION
Masakazu Hayashi
C03 - GLASS MINERAL OR SLAG WOOL