Masakazu Kanezawa

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Shiroi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect inspection method and device therefor
- Patent number 9,148,631
- Issue date Sep 29, 2015
- Hitachi High-Technologies Corporation
- Makoto Ono
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION METHOD AND DEVICE THEREFOR
- Publication number 20130235182
- Publication date Sep 12, 2013
- Makoto Ono
- G01 - MEASURING TESTING