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Masakazu Kanosue
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Nagoya, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for manufacturing semiconductor dynamic quantity sensor
Patent number
6,287,885
Issue date
Sep 11, 2001
Denso Corporation
Hiroshi Muto
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method for fabrication of a semiconductor sensor
Patent number
6,143,584
Issue date
Nov 7, 2000
Denso Corporation
Tsuyoshi Fukada
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor sensor having multi-layer movable beam structure film
Patent number
5,936,159
Issue date
Aug 10, 1999
Nippondenso Co., Ltd.
Kazuhiko Kano
G01 - MEASURING TESTING
Information
Patent Grant
Method for fabricating a semiconductor acceleration sensor
Patent number
5,851,851
Issue date
Dec 22, 1998
Nippondenso Co., Ltd.
Hirofumi Uenoyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor sensor with a built-in amplification circuit
Patent number
5,770,883
Issue date
Jun 23, 1998
Nippondenso Co., Ltd.
Koki Mizuno
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor acceleration sensor with source and drain regions
Patent number
5,627,397
Issue date
May 6, 1997
Nippondenso Co., Ltd.
Kazuhiko Kano
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor acceleration sensor with beam structure
Patent number
5,619,050
Issue date
Apr 8, 1997
Nippondenso Co., Ltd.
Hirofumi Uenoyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor sensor method
Patent number
5,587,343
Issue date
Dec 24, 1996
Nippondenso Co., Ltd.
Kazuhiko Kano
G01 - MEASURING TESTING