Masakazu Sato

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Fukushima, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for evaluating semiconductor wafer, method for selecting sem...
- Patent number 12,300,553
- Issue date May 13, 2025
- Shin-Etsu Handotai Co., Ltd.
- Junya Suzuki
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of evaluating shape of semiconductor wafer and apparatus for...
- Patent number 7,209,857
- Issue date Apr 24, 2007
- Shin-Etsu Handotai Co., Ltd.
- Masakazu Sato
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal silicon wafer
- Patent number 6,387,466
- Issue date May 14, 2002
- Shin-Etsu Handotai Co., Ltd.
- Izumi Fusegawa
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EVALUATING SEMICONDUCTOR WAFER, METHOD FOR SELECTING SEM...
- Publication number 20240128130
- Publication date Apr 18, 2024
- Shin-Etsu Handotai Co., Ltd.
- Junya SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor wafer shape evaluating method and shape evaluating de...
- Publication number 20050255610
- Publication date Nov 17, 2005
- SHIN-ETSU HANDOTAI CO LTD
- Masakazu Sato
- G01 - MEASURING TESTING