Masakazu SUGAYA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Cancer test system and method for assessing cancer test
- Patent number 11,443,851
- Issue date Sep 13, 2022
- Hirotsu Bio Science Inc.
- Minoru Sakairi
- G01 - MEASURING TESTING
Information Patent Grant
Cancer analysis system and cancer analysis method
- Patent number 11,249,069
- Issue date Feb 15, 2022
- Hirotsu Bio Science Inc.
- Minoru Sakairi
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic CT device
- Patent number 10,945,684
- Issue date Mar 16, 2021
- Hitachi, Ltd.
- Yushi Tsubota
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Liquid feeding device and cell culture device
- Patent number 10,329,525
- Issue date Jun 25, 2019
- Hitachi, Ltd.
- Masaharu Kiyama
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Liquid delivery device and cell culture device using same
- Patent number 10,184,100
- Issue date Jan 22, 2019
- Hitachi, Ltd.
- Masaharu Kiyama
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Charged particle beam apparatus and sample elevating apparatus
- Patent number 10,153,128
- Issue date Dec 11, 2018
- Hitachi High-Technologies Corporation
- Masakazu Sugaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cell culture device
- Patent number 10,138,450
- Issue date Nov 27, 2018
- Hitachi, Ltd.
- Takayuki Nozaki
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Cell culturing device, culturing vessel, and holding vessel
- Patent number 10,087,410
- Issue date Oct 2, 2018
- Hitachi, Ltd.
- Takayuki Nozaki
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Substance-testing apparatus, substance-testing system, and substanc...
- Patent number 10,048,172
- Issue date Aug 14, 2018
- Hitachi, Ltd.
- Masakazu Sugaya
- G01 - MEASURING TESTING
Information Patent Grant
Microparticle detection device and security gate
- Patent number 9,850,696
- Issue date Dec 26, 2017
- Hitachi, Ltd.
- Masakazu Sugaya
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Grant
Attached matter testing device and testing method
- Patent number 9,696,288
- Issue date Jul 4, 2017
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Particle analyzing device
- Patent number 9,423,388
- Issue date Aug 23, 2016
- Hitachi, Ltd.
- Koichi Terada
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer for substance
- Patent number 9,417,163
- Issue date Aug 16, 2016
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Attached matter inspection device
- Patent number 9,261,437
- Issue date Feb 16, 2016
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 9,214,324
- Issue date Dec 15, 2015
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 9,040,905
- Issue date May 26, 2015
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam application system
- Patent number 7,408,760
- Issue date Aug 5, 2008
- Hitachi High-Technologies Corporation
- Sayaka Tanimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mechanism for sealing
- Patent number 7,341,393
- Issue date Mar 11, 2008
- Canon Kabushiki Kaisha
- Masaki Hosoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser interferometer displacement measuring system, exposure appara...
- Patent number 6,839,142
- Issue date Jan 4, 2005
- Hitachi, Ltd.
- Fumio Isshiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam as well as method and equipment for specimen fabrication
- Patent number 6,717,156
- Issue date Apr 6, 2004
- Hitachi, Ltd.
- Masakazu Sugaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser interferometer displacement measuring system, exposure appara...
- Patent number 6,687,013
- Issue date Feb 3, 2004
- Hitachi, Ltd.
- Fumio Isshiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate temperature control system and method for controlling tem...
- Patent number 6,518,548
- Issue date Feb 11, 2003
- Hitachi, Ltd.
- Masakazu Sugaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate temperature control system and method for controlling tem...
- Patent number 6,394,797
- Issue date May 28, 2002
- Hitachi, Ltd.
- Masakazu Sugaya
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SIZE DISTRIBUTION MEASUREMENT DEVICE, SIZE DISTRIBUTION MEASUREMENT...
- Publication number 20220065766
- Publication date Mar 3, 2022
- Hitachi High-Tech Science Corporation
- Yumiko Anzai
- G01 - MEASURING TESTING
Information Patent Application
MIRROR ELECTRONIC INSPECTION DEVICE
- Publication number 20210313138
- Publication date Oct 7, 2021
- HITACHI HIGH-TECH CORPORATION
- Masahiro YAMAOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRASONIC CT DEVICE
- Publication number 20190290223
- Publication date Sep 26, 2019
- Hitachi, Ltd.
- Yushi TSUBOTA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CANCER ANALYSIS SYSTEM AND CANCER ANALYSIS METHOD
- Publication number 20190079071
- Publication date Mar 14, 2019
- Hitachi, Ltd
- Minoru SAKAIRI
- G01 - MEASURING TESTING
Information Patent Application
Cancer Test System and Method for Assessing Cancer Test
- Publication number 20180313839
- Publication date Nov 1, 2018
- Hitachi, Ltd
- Minoru SAKAIRI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND SAMPLE ELEVATING APPARATUS
- Publication number 20180138009
- Publication date May 17, 2018
- Hitachi High-Technologies Corporation
- Masakazu SUGAYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLOSED-SYSTEM CULTURE VESSEL, TRANSPORT METHOD, AND AUTOMATED CULTU...
- Publication number 20170342365
- Publication date Nov 30, 2017
- Takayuki NOZAKI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
LIQUID FEEDING DEVICE AND CELL CULTURE DEVICE
- Publication number 20170198249
- Publication date Jul 13, 2017
- Hitachi, Ltd
- Masaharu KIYAMA
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
CELL CULTURING DEVICE AND CLOSED-SYSTEM CULTURE VESSEL
- Publication number 20170145365
- Publication date May 25, 2017
- Hitachi, Ltd
- Takayuki NOZAKI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Substance-Testing Apparatus, Substance-Testing System, and Substanc...
- Publication number 20170102296
- Publication date Apr 13, 2017
- Hitachi, Ltd
- Masakazu SUGAYA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED CULTURE DEVICE
- Publication number 20160244713
- Publication date Aug 25, 2016
- Hitachi, Ltd
- Taku NAKAMURA
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
LIQUID DELIVERY DEVICE AND CELL CULTURE DEVICE USING SAME
- Publication number 20160108350
- Publication date Apr 21, 2016
- Hitachi, Ltd
- Masaharu KIYAMA
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
CELL CULTURING DEVICE, CULTURING VESSEL, AND HOLDING VESSEL
- Publication number 20160017271
- Publication date Jan 21, 2016
- Hitachi, Ltd
- Takayuki NOZAKI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
CELL CULTURE DEVICE
- Publication number 20160002584
- Publication date Jan 7, 2016
- Hitachi, Ltd
- Takayuki NOZAKI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Particle Analyzing Device
- Publication number 20150377851
- Publication date Dec 31, 2015
- Hitachi, Ltd
- Koichi TERADA
- G01 - MEASURING TESTING
Information Patent Application
ATTACHED MATTER INSPECTION DEVICE
- Publication number 20150233796
- Publication date Aug 20, 2015
- Hitachi, Ltd
- Hideo KASHIMA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20150235831
- Publication date Aug 20, 2015
- Hitachi, Ltd
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microparticle Detection Device and Security Gate
- Publication number 20150136975
- Publication date May 21, 2015
- Hitachi, Ltd
- Masakazu Sugaya
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Application
DIRECTION OF MOTION CONVERSION MECHANISM, ACTUATOR DEVICE USING THE...
- Publication number 20150068627
- Publication date Mar 12, 2015
- Hitachi, Ltd.
- Kunio HARADA
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
ANALYZER FOR SUBSTANCE
- Publication number 20140260542
- Publication date Sep 18, 2014
- Hitachi, Ltd
- Hisashi NAGANO
- G01 - MEASURING TESTING
Information Patent Application
ATTACHED MATTER TESTING DEVICE AND TESTING METHOD
- Publication number 20140238106
- Publication date Aug 28, 2014
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20140151543
- Publication date Jun 5, 2014
- Hitachi, Ltd
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR AND ENTRY CONTROL SYSTEM
- Publication number 20120139736
- Publication date Jun 7, 2012
- Yasutaka Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam application system
- Publication number 20060056131
- Publication date Mar 16, 2006
- Sayaka Tanimoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mechanism for sealing
- Publication number 20060006342
- Publication date Jan 12, 2006
- Canon Kabushiki Kaisha
- Masaki Hosoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser interferometer displacement measuring system, exposure appara...
- Publication number 20040057055
- Publication date Mar 25, 2004
- Fumio Isshiki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Beam as well as method and equipment for specimen fabrication
- Publication number 20020166976
- Publication date Nov 14, 2002
- Masakazu Sugaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Substrate temperature control system and method for controlling tem...
- Publication number 20020113056
- Publication date Aug 22, 2002
- Hitachi, Ltd.
- Masakazu Sugaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser interferometer displacement measuring system, exposure appara...
- Publication number 20020048026
- Publication date Apr 25, 2002
- Fumio Isshiki
- H01 - BASIC ELECTRIC ELEMENTS

Masakazu SUGAYA

Person

Patents Grantslast 30 patents

Cancer test system and method for assessing cancer test

Cancer analysis system and cancer analysis method

Ultrasonic CT device

Liquid feeding device and cell culture device

Liquid delivery device and cell culture device using same

Charged particle beam apparatus and sample elevating apparatus

Cell culture device

Cell culturing device, culturing vessel, and holding vessel

Substance-testing apparatus, substance-testing system, and substanc...

Microparticle detection device and security gate

Attached matter testing device and testing method

Particle analyzing device

Analyzer for substance

Attached matter inspection device

Analysis device and analysis method

Analysis device and analysis method

Charged particle beam application system

Mechanism for sealing

Laser interferometer displacement measuring system, exposure appara...

Beam as well as method and equipment for specimen fabrication

Laser interferometer displacement measuring system, exposure appara...

Substrate temperature control system and method for controlling tem...

Substrate temperature control system and method for controlling tem...

Patents Applicationslast 30 patents

SIZE DISTRIBUTION MEASUREMENT DEVICE, SIZE DISTRIBUTION MEASUREMENT...

MIRROR ELECTRONIC INSPECTION DEVICE

ULTRASONIC CT DEVICE

CANCER ANALYSIS SYSTEM AND CANCER ANALYSIS METHOD

Cancer Test System and Method for Assessing Cancer Test

CHARGED PARTICLE BEAM APPARATUS AND SAMPLE ELEVATING APPARATUS

CLOSED-SYSTEM CULTURE VESSEL, TRANSPORT METHOD, AND AUTOMATED CULTU...

LIQUID FEEDING DEVICE AND CELL CULTURE DEVICE

CELL CULTURING DEVICE AND CLOSED-SYSTEM CULTURE VESSEL

Substance-Testing Apparatus, Substance-Testing System, and Substanc...

AUTOMATED CULTURE DEVICE

LIQUID DELIVERY DEVICE AND CELL CULTURE DEVICE USING SAME

CELL CULTURING DEVICE, CULTURING VESSEL, AND HOLDING VESSEL

CELL CULTURE DEVICE

Particle Analyzing Device

ATTACHED MATTER INSPECTION DEVICE

ANALYSIS DEVICE AND ANALYSIS METHOD

Microparticle Detection Device and Security Gate

DIRECTION OF MOTION CONVERSION MECHANISM, ACTUATOR DEVICE USING THE...

ANALYZER FOR SUBSTANCE

ATTACHED MATTER TESTING DEVICE AND TESTING METHOD

ANALYSIS DEVICE AND ANALYSIS METHOD

DETECTOR AND ENTRY CONTROL SYSTEM

Charged particle beam application system

Mechanism for sealing

Laser interferometer displacement measuring system, exposure appara...

Beam as well as method and equipment for specimen fabrication

Substrate temperature control system and method for controlling tem...

Laser interferometer displacement measuring system, exposure appara...